SCHEMBL10001288

SCHEMBL10001288

FC1(F)CCO1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8161557 0.75
SCHEMBL2846075 0.75
SCHEMBL10420603 0.68
SCHEMBL15052687 0.68
SCHEMBL11700376 0.67
SCHEMBL5665559 0.67
SCHEMBL30976571 0.66
SCHEMBL5177665 0.66
SCHEMBL13089 0.64
SCHEMBL3582156 0.64

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 12 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-115598925-A Composition for optical sensor, and solid-state imaging element and camera module using the optical sensor JSR株式会社(JP) 2023-01-13 CN disclosed
CN-113121779-B Biperfluor branched ether chain oxetane series fluorine-containing polymer and preparation method thereof 南京理工大学 2022-06-28 CN disclosed
CN-113121779-A Biperfluor branched ether chain oxetane series fluorine-containing polymer and preparation method thereof 南京理工大学 2021-07-16 CN disclosed
WO-2021065908-A1 METHOD FOR PRODUCING PROPIONIC ACID DERIVATIVE ダイキン工業株式会社 2021-04-08 WO disclosed
CN-110850680-A Curable composition, display element, and method for forming cured film JSR株式会社 2020-02-28 CN disclosed
CN-104871089-B Photosensitive resin composition, method for producing cured film, organic EL display device, and liquid crystal display device 富士胶片株式会社 2020-01-14 CN disclosed
US-9012129-B2 Resist composition, method of forming resist pattern, novel compound, and acid generator TOKYO OHKA KOGYO CO., LTD. (JO) 2015-04-21 US disclosed
US-20140120472-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, NOVEL COMPOUND, AND ACID GENERATOR TOKYO OHKA KOGYO CO., LTD. (JP) 2014-05-01 US disclosed
US-8476435-B2 Method for producing fluorine-containing polyether carboxylic acid amide UNIMATEC CO., LTD. (JP) 2013-07-02 US disclosed
US-8415085-B2 Resist composition, method of forming resist pattern, novel compound, and acid generator TOKYO OHKA KOGYO CO., LTD. (JP) 2013-04-09 US disclosed
US-20120264061-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, NOVEL COMPOUND, AND ACID GENERATOR TOKYO OHKA KOGYO CO., LTD. (JP) 2012-10-18 US disclosed
US-20120041201-A1 METHOD FOR PRODUCING FLUORINE-CONTAINING POLYETHER CARBOXYLIC ACID AMIDE UNIMATEC CO., LTD. (JP) 2012-02-16 US disclosed