SCHEMBL119889

SCHEMBL119889

O=C(O)CN(CCCCNC(=O)OCC1c2ccccc2-c2ccccc21)C(=O)OC1c2ccccc2-c2ccccc21

nearest known ligand 0.62

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
KMT2A Q03164 2/20 0.62
EPHX2 P34913 1/20 0.40
OPRD1 P41143 1/20 0.39
CASP3 P42574 2/20 0.39
DOT1L Q8TEK3 1/20 0.37
FABP7 O15540 1/20 0.36
FABP5 Q01469 1/20 0.36
TLR2 O60603 1/20 0.36
TLR1 Q15399 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL119596 0.97 KMT2A (0.60) KMT2AEPHX2OPRD1CASP3DOT1L
SCHEMBL119411 0.93 KMT2A (0.56) KMT2AEPHX2OPRD1CASP3FABP7
SCHEMBL18041255 0.84 KMT2A (0.61) KMT2AEPHX2OPRD1CASP3FABP7
SCHEMBL31646021 0.83 KMT2A (0.58) KMT2AEPHX2OPRD1CASP3DOT1L
SCHEMBL25357039 0.82 KMT2A (0.54) KMT2AEPHX2CASP3FABP7FABP5
SCHEMBL4599714 0.82 KMT2A (0.54) KMT2ACASP3TLR2TLR1
SCHEMBL31688567 0.82 KMT2A (0.57) KMT2AEPHX2OPRD1CASP3DOT1L
SCHEMBL30037641 0.82 KMT2A (0.54) KMT2ACASP3TLR2TLR1
SCHEMBL13573482 0.82 KMT2A (0.56) KMT2ATLR2TLR1
SCHEMBL21544410 0.81 KMT2A (0.64) KMT2AEPHX2OPRD1CASP3DOT1L

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8895231-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-25 US disclosed
US-8895231-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-25 US disclosed
US-20120058428-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-08 US disclosed
US-20120058428-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-08 US disclosed