SCHEMBL12009277

SCHEMBL12009277

CC1C(C)C2CC1C1C3CC(C21)C(C(=O)OC1CCCCO1)(C(F)(F)F)C3

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12009262 0.87 — —
SCHEMBL13758539 0.81 — —
SCHEMBL13758546 0.76 SLC1A2 (0.31) —
SCHEMBL12009273 0.72 CYP17A1 (0.30) —
SCHEMBL111551 0.69 — —
SCHEMBL9608714 0.67 — —
SCHEMBL30663525 0.67 ABCB1 (0.30) —
SCHEMBL16263965 0.67 MEN1 (0.30) —
SCHEMBL17875130 0.65 — —
SCHEMBL22143429 0.65 — —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8252508-B2 Positive photosensitive composition and method of forming resist pattern FUJIFILM CORPORATION (JP) 2012-08-28 — — US disclosed
US-7867697-B2 Positive photosensitive composition and method of forming resist pattern FUJIFILM CORPORATION (JP) 2011-01-11 — — US disclosed
US-20100261117-A1 POSITIVE PHOTOSENSITIVE COMPOSITION AND METHOD OF FORMING RESIST PATTERN FUJIFILM CORPORATION (JP) 2010-10-14 — — US disclosed
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