SCHEMBL12110237

SCHEMBL12110237

CC(OC(=O)C12CC3CC(CC(C3)C1)C2)C(F)(F)S

nearest known ligand 0.47

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
CYP17A1 P05093 5/20 0.47
CYP19A1 P11511 5/20 0.47
PRKCA P17252 1/20 0.44
SCN1A P35498 1/20 0.38
SCN2A Q99250 1/20 0.38
SCN3A Q9NY46 1/20 0.38
HSD17B10 Q99714 1/20 0.38
MAPT P10636 3/20 0.37
GAA P10253 1/20 0.37
XBP1 P17861 1/20 0.37
CA2 P00918 1/20 0.37
ALDH1A1 P00352 2/20 0.36
GLA P06280 1/20 0.36
MEN1 O00255 1/20 0.36
KMT2A Q03164 1/20 0.36
NPSR1 Q6W5P4 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16938867 0.87 CYP17A1 (0.49) CYP17A1CYP19A1PRKCASCN1ASCN2A
SCHEMBL6367597 0.85 CYP17A1 (0.48) CYP17A1CYP19A1PRKCASCN1ASCN2A
SCHEMBL16589179 0.84 CYP17A1 (0.47) CYP17A1CYP19A1PRKCASCN1ASCN2A
SCHEMBL16731584 0.81 CYP17A1 (0.50) CYP17A1CYP19A1PRKCASCN1ASCN2A
SCHEMBL16731576 0.81 CYP17A1 (0.50) CYP17A1CYP19A1PRKCASCN1ASCN2A
SCHEMBL16731585 0.81 CYP17A1 (0.50) CYP17A1CYP19A1PRKCASCN1ASCN2A
SCHEMBL16169967 0.81 CYP17A1 (0.45) CYP17A1CYP19A1PRKCASCN1ASCN2A
SCHEMBL16382610 0.81 CYP17A1 (0.42) CYP17A1CYP19A1PRKCASCN1ASCN2A
SCHEMBL120312 0.80 CYP17A1 (0.44) CYP17A1CYP19A1PRKCASCN1ASCN2A
SCHEMBL16731832 0.77 CYP17A1 (0.55) CYP17A1CYP19A1PRKCASCN1ASCN2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20110269072-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE SAME FUJIFILM CORPORATION (JP) 2011-11-03 US disclosed
EP-2101217-B1 Sulfonium salt-containing polymer, resist compositon, and patterning process SHINETSU CHEMICAL CO (JP) 2011-05-11 EP disclosed
EP-2112554-A2 Sulfonium salt-containing polymer, resist composition, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2009-10-28 EP disclosed
EP-2105794-A1 Novel photoacid generator, resist composition, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2009-09-30 EP disclosed