SCHEMBL1230362

SCHEMBL1230362

NCCNC[Si](O)(O)O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28966448 0.89 CA12 (0.52)
SCHEMBL15981446 0.78
SCHEMBL11309337 0.78 CA12 (0.71)
Trientine SCHEMBL11576008 0.75 CA12 (0.73)
SCHEMBL28966425 0.74 CA12 (0.56)
SCHEMBL231988 0.72 CA12 (0.55)
SCHEMBL1975917 0.71
SCHEMBL5314937 0.69 CA12 (1.00)
SCHEMBL15381 0.69
SCHEMBL20666068 0.69 CA12 (0.50)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 14 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12365766-B2 Organopolysiloxane composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-07-22 US disclosed
US-20230078106-A1 ORGANOPOLYSILOXANE COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-03-16 US disclosed
EP-4144789-A1 ORGANOPOLYSILOXANE COMPOSITION Shin-Etsu Chemical Co., Ltd. (JP) 2023-03-08 EP disclosed
CN-115745428-A Organopolysiloxane composition 信越化学工业株式会社 2023-03-07 CN disclosed
US-8658346-B2 Pattern forming process, chemically amplified positive resist composition, and resist-modifying composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-25 US disclosed
US-8426105-B2 Resist-modifying composition and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-04-23 US disclosed
US-8367310-B2 Pattern forming process and resist-modifying composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-02-05 US disclosed
US-8329384-B2 Resist-modifying composition and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-12-11 US disclosed
US-20110033799-A1 PATTERN FORMING PROCESS, CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION, AND RESIST-MODIFYING COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-02-10 US disclosed
US-20100297554-A1 RESIST-MODIFYING COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-25 US disclosed
US-20100297563-A1 RESIST-MODIFYING COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-25 US disclosed
US-20100209849-A1 PATTERN FORMING PROCESS AND RESIST-MODIFYING COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-08-19 US disclosed
US-20100159392-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-24 US disclosed
US-20100086878-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-04-08 US disclosed