SCHEMBL12378938

SCHEMBL12378938

CCC(C)(C)C(=O)OC1(C)CCC(C)C1

nearest known ligand 0.32

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
CYP1A2 P05177 1/20 0.32
DPP4 P27487 1/20 0.30
RIPK1 Q13546 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15473007 0.91 CYP1A2 (0.40) CYP1A2
SCHEMBL16900295 0.83 KDM4E (0.31) CYP1A2
SCHEMBL47387 0.81 HMGCR (0.32)
SCHEMBL19084583 0.81
SCHEMBL16900292 0.80
SCHEMBL132884 0.80 CYP1A2 (0.31) CYP1A2
SCHEMBL14258820 0.79
SCHEMBL13607368 0.79
SCHEMBL16900289 0.79 KDM4E (0.34) CYP1A2
SCHEMBL13496203 0.79 HMGCR (0.30)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1975705-B1 Positive resist composition and pattern-forming method FUJIFILM CORP (JP) 2016-04-27 EP disclosed
US-9086624-B2 Monomer, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-21 US disclosed
US-9081290-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-14 US disclosed
US-9017931-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-04-28 US disclosed
US-8945810-B2 Positive resist composition and pattern-forming method FUJIFILM CORPORATION (JP) 2015-02-03 US disclosed
US-8945810-B2 Positive resist composition and pattern-forming method FUJIFILM CORPORATION (JP) 2015-02-03 US disclosed
US-20140051026-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-20 US disclosed
US-20140045123-A1 MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-13 US disclosed
US-7998654-B2 Positive resist composition and pattern-forming method FUJIFILM CORPORATION (JP) 2011-08-16 US disclosed
US-7998654-B2 Positive resist composition and pattern-forming method FUJIFILM CORPORATION (JP) 2011-08-16 US disclosed
US-20080248425-A1 Adjust solubility of alkali developer using acid; acid generator; actinic radiation FUJIFILM CORPORATION (JP) 2008-10-09 US disclosed
US-20080248425-A1 Adjust solubility of alkali developer using acid; acid generator; actinic radiation FUJIFILM CORPORATION (JP) 2008-10-09 US disclosed
EP-1975705-A2 Positive resist composition and pattern-forming method FUJIFILM Corporation (JP) 2008-10-01 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20140045123-A1 MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS MMAB, PARG, DNMT3A CYP1A2 2048/4885DPP4 4351/4885RIPK1 391/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.