SCHEMBL13201519

SCHEMBL13201519

CCC(C)(C)C(=O)OC1C(O)C2CC1C1C3CCC(C3)C21

nearest known ligand 0.38

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
HMGCR P04035 2/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13829226 0.82 HMGCR (0.37) HMGCR
SCHEMBL13201518 0.81 HMGCR (0.35) HMGCR
SCHEMBL17465460 0.79 HMGCR (0.32) HMGCR
SCHEMBL13430234 0.77 HMGCR (0.36) HMGCR
SCHEMBL13829227 0.77 HMGCR (0.39) HMGCR
SCHEMBL13219628 0.77 SLCO1B1 (0.31)
SCHEMBL20101400 0.77 HMGCR (0.33) HMGCR
SCHEMBL25701420 0.76 HMGCR (0.34) HMGCR
SCHEMBL132135 0.76 SLCO1B1 (0.31)
SCHEMBL27052521 0.76 CHRM1 (0.31)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7771913-B2 Resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-08-10 US disclosed
US-7642034-B2 Photoresists; (meth)acrylate fluoropolymer which is insoluble in water, dissolvable in aqueous alkaline solution, and immiscible with resist films so that it enables pattern formation by the immersion lithography SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-01-05 US disclosed
US-20070231738-A1 Resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-10-04 US disclosed
US-20070178407-A1 Polymer, resist protective coating material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2007-08-02 US disclosed