⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL28796528 | 0.97 | TSHR (0.50) | — | |
| SCHEMBL271356 | 0.97 | — | — | |
| SCHEMBL2625315 | 0.97 | — | — | |
| SCHEMBL801027 | 0.97 | — | — | |
| SCHEMBL27338395 | 0.94 | — | — | |
| Acetic Acid SCHEMBL27917011 | 0.84 | RNPEP (0.41) | — | |
| SCHEMBL7136126 | 0.82 | RNPEP (0.44) | — | |
| SCHEMBL20917620 | 0.80 | TSHR (0.39) | — | |
| SCHEMBL22456 | 0.79 | TSHR (0.41) | — | |
| SCHEMBL283526 | 0.78 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 86 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-8859437-B2 | Solution for etching a thin film transistor and method of manufacturing the same | THE PENN STATE RESEARCH FOUNDATION (US) | 2014-10-14 | — | — | US | claimed |
| US-20140193945-A1 | SOLUTION FOR ETCHING A THIN FILM TRANSISTOR AND METHOD OF MANUFACTURING THE SAME | THE PENN STATE RESEARCH FOUNDATION | 2014-07-10 | — | — | US | claimed |
| EP-2122418-B1 | STRIPPER FOR COATING LAYER | AZ ELECTRONIC MATERIALS USA (US) | 2012-08-08 | — | — | EP | claimed |
| US-20120187336-A1 | CONDITIONING COMPOSITIONS FOR SOLAR CELLS | SURFACE CHEMISTRY DISCOVERIES, INC. (US) | 2012-07-26 | — | — | US | claimed |
| US-8026201-B2 | Comprising: a fluoride source, an organic quaternary ammonium base, and a solvent selected from an organic solvent, water, and mixtures thereof; for removing silicon-based anti-reflective coatings/hardmask layers from microelectronics; etch selectivity | AZ ELECTRONIC MATERIALS USA CORP. (US) | 2011-09-27 | — | — | US | claimed |
| EP-2122418-A2 | STRIPPER FOR COATING LAYER | AZ Electronic Materials USA Corp. (US) | 2009-11-25 | — | — | EP | claimed |
| US-20090120457-A1 | COMPOSITIONS AND METHOD FOR REMOVING COATINGS AND PREPARATION OF SURFACES FOR USE IN METAL FINISHING, AND MANUFACTURING OF ELECTRONIC AND MICROELECTRONIC DEVICES | SURFACE CHEMISTRY DISCOVERIES, INC. (US) | 2009-05-14 | — | — | US | claimed |
| WO-2008081416-A2 | STRIPPER FOR COATING LAYER | AZ ELECTRONIC MATERIALS USA CORP. (DE) | 2008-07-10 | — | — | WO | claimed |
| US-20080161217-A1 | Stripper for Coating Layer | MERCK PATENT GMBH (DE) | 2008-07-03 | — | — | US | claimed |
| EP-1027415-A1 | CLEANING COMPOSITIONS AND METHODS FOR CLEANING RESIN AND POLYMERIC MATERIALS USED IN MANUFACTURE | Kyzen Corporation (US) | 2000-08-16 | — | — | EP | claimed |
| WO-1999016855-A1 | CLEANING COMPOSITIONS AND METHODS FOR CLEANING RESIN AND POLYMERIC MATERIALS USED IN MANUFACTURE | KYZEN CORPORATION (US) | 1999-04-08 | — | — | WO | claimed |
| US-10304694-B2 | Semiconductor treatment composition and treatment method | JSR CORPORATION (JP) | 2019-05-28 | — | — | US | disclosed |
| US-20190122896-A1 | SEMICONDUCTOR TREATMENT COMPOSITION | JSR CORPORATION (JP) | 2019-04-25 | — | — | US | disclosed |
| US-20180226267-A1 | SEMICONDUCTOR TREATMENT COMPOSITION AND TREATMENT METHOD | JSR CORPORATION (JP) | 2018-08-09 | — | — | US | disclosed |
| US-9663715-B2 | Polycrystalline texturing composition and method | SUN CHEMICAL CORPORATION (US) | 2017-05-30 | — | — | US | disclosed |
| WO-1998016330-A1 | CLEANING WAFER SUBSTRATES OF METAL CONTAMINATION WHILE MAINTAINING WAFER SMOOTHNESS | MALLINCKRODT BAKER, INC. (US) | 1998-04-23 | — | — | WO | disclosed |
| US-5498293-A | TREATMENT WITH ALKALINE SOLUTION AND AMPHOTERIC SURFACTANT | MALLINCKRODT BAKER, INC. (US) | 1996-03-12 | — | — | US | disclosed |
| EP-0690483-A2 | Cleaning wafer substrates of metal contamination while maintaining wafer smoothness | MALLINCKRODT BAKER, Inc. (US) | 1996-01-03 | — | — | EP | disclosed |
| US-5466389-A | Cleaning compounds with metal free base and surfactant | J. T. BAKER INC. (US) | 1995-11-14 | — | — | US | disclosed |
| EP-0678571-A2 | pH Adjusted nonionic surfactant containing alkaline cleaner composition for cleaning microelectronics substrates | MALLINCKRODT BAKER, Inc. (US) | 1995-10-25 | — | — | EP | disclosed |