SCHEMBL1358533

SCHEMBL1358533

FCC(F)(F)C(F)(F)C(F)F

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17646124 0.87
SCHEMBL1358616 0.81 KDM4E (0.34)
SCHEMBL14433080 0.79 TSHR (0.34)
SCHEMBL9001859 0.77 TSHR (0.37)
SCHEMBL15402639 0.75
SCHEMBL15403495 0.75
SCHEMBL13555425 0.75
SCHEMBL15403267 0.75
SCHEMBL1358124 0.75
SCHEMBL15403028 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 26 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12183591-B2 Etching gas compositions, methods of forming micropatterns, and methods of manufacturing semiconductor device SAMSUNG ELECTRONICS CO., LTD. (KR) 2024-12-31 US claimed
US-20220310407-A1 ETCHING GAS COMPOSITIONS, METHODS OF FORMING MICROPATTERNS, AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE Wonik Materials (KR) 2022-09-29 US claimed
US-5346645-A Desiccant composition and a method of desiccating articles DAIKIN INDUSTRIES, LTD. (JP) 1994-09-13 US claimed
JP-5214373-A None JP disclosed
US-12183591-B2 Etching gas compositions, methods of forming micropatterns, and methods of manufacturing semiconductor device SAMSUNG ELECTRONICS CO., LTD. (KR) 2024-12-31 US disclosed
US-20240234031-A1 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR APPARATUS AND ELECTRONIC APPARATUS INCLUDING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2024-07-11 US disclosed
US-11859312-B2 Method of cleaning a group III-nitride single crystal substrate comprising cleaning a nitrogen-polar face with a detergent including a fluoroorganic compound TOKUYAMA CORPORATION (JP) 2024-01-02 US disclosed
US-20230313413-A1 METHOD OF CLEANING GROUP III NITRIDE SINGLE CRYSTAL SUBSTRATE, AND METHOD OF PRODUCING THE SAME TOKUYAMA CORPORATION (JP) 2023-10-05 US disclosed
US-20220310407-A1 ETCHING GAS COMPOSITIONS, METHODS OF FORMING MICROPATTERNS, AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE Wonik Materials (KR) 2022-09-29 US disclosed
US-20170032813-A1 IONIC PERFLUOROPOLYETHER LUBRICANT FUJI ELECTRIC (MALAYSIA) SDN, BHD. (MY) 2017-02-02 US disclosed
EP-2684870-A1 METHOD FOR PREPARING THIOCARBOXYLIC ACID S-(FLUOROALKYL) ESTER Sumitomo Chemical Company Limited (JP) 2014-01-15 EP disclosed
EP-1288284-B1 CLEANING AGENT, CLEANING METHOD AND CLEANING APPARATUS ASAHI CHEMICAL IND (JP) 2008-10-29 EP disclosed
US-20060249179-A1 Process for removing water and apparatus for removing water ASAHI GLASS COMPANY, LIMITED (JP) 2006-11-09 US disclosed
EP-1719550-A1 METHOD OF DEWATERING AND DEWATERING APPARATUS Asahi Glass Company, Limited (JP) 2006-11-08 EP disclosed
US-20030168079-A1 Cleaning agent, cleaning method and cleaning apparatus TOKUYAMA METEL CORPORATION (JP) 2003-09-11 US disclosed
EP-1288284-A1 CLEANING AGENT, CLEANING METHOD AND CLEANING APPARATUS Asahi Kasei Kabushiki Kaisha (JP) 2003-03-05 EP disclosed
EP-0516029-B1 A method of desiccating articles DAIKIN IND LTD (JP) 1995-04-05 EP disclosed
US-5346645-A Desiccant composition and a method of desiccating articles DAIKIN INDUSTRIES, LTD. (JP) 1994-09-13 US disclosed
JP-H05214373-A 1H,1H,4H-PERFLUOROBUTANE-BASED CLEANING SOLVENT ASAHI CHEM IND CO LTD 1993-08-24 JP disclosed
EP-0516029-A1 A method of desiccating articles DAIKIN INDUSTRIES, LIMITED (JP) 1992-12-02 EP disclosed