SCHEMBL14655836

SCHEMBL14655836

CC1(OC([O])=O)CCCC1

nearest known ligand 0.41

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
CYP19A1 P11511 1/20 0.41
NPSR1 Q6W5P4 1/20 0.32
FFAR3 O14843 1/20 0.32
SCN1A P35498 1/20 0.32
SCN2A Q99250 1/20 0.32
SCN3A Q9NY46 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12986568 0.81 CYP19A1 (0.42) CYP19A1NPSR1FFAR3SCN1ASCN2A
SCHEMBL4872716 0.79 CYP19A1 (0.44) CYP19A1NPSR1FFAR3SCN1ASCN2A
SCHEMBL14982574 0.79 CYP19A1 (0.41) CYP19A1NPSR1FFAR3SCN1ASCN2A
SCHEMBL6079757 0.79 CYP19A1 (0.44) CYP19A1NPSR1FFAR3SCN1ASCN2A
SCHEMBL12986569 0.79 CYP19A1 (0.41) CYP19A1NPSR1FFAR3SCN1ASCN2A
SCHEMBL25383029 0.79 CYP19A1 (0.44) CYP19A1NPSR1FFAR3SCN1ASCN2A
SCHEMBL135404 0.79 CYP19A1 (0.41) CYP19A1NPSR1FFAR3SCN1ASCN2A
SCHEMBL10702855 0.77 CYP19A1 (0.40) CYP19A1NPSR1FFAR3SCN1ASCN2A
SCHEMBL183131 0.77 CYP19A1 (0.43) CYP19A1NPSR1FFAR3SCN1ASCN2A
SCHEMBL12332047 0.77 CYP19A1 (0.40) CYP19A1NPSR1FFAR3SCN1ASCN2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 15 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11543749-B2 Resist composition and method for producing resist pattern, and method for producing plated molded article SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-01-03 US disclosed
CN-106610566-B Chemically amplified positive resist composition and patterning method 信越化学工业株式会社 2021-10-08 CN disclosed
US-20210278765-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN, AND METHOD FOR PRODUCING PLATED MOLDED ARTICLE SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2021-09-09 US disclosed
CN-113296357-A Resist composition, method for producing resist pattern, and method for producing plated molded article 住友化学株式会社 2021-08-24 CN disclosed
CN-106444288-B Chemically amplified positive resist composition and pattern forming method 信越化学工业株式会社 2021-04-09 CN disclosed
EP-3163374-B1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHINETSU CHEMICAL CO (JP) 2020-12-02 EP disclosed
US-10815572-B2 Chemically amplified positive resist composition and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2020-10-27 US disclosed
EP-3128368-B1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2018-01-24 EP disclosed
EP-3163374-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2017-05-03 EP disclosed
US-20170115567-A1 Chemically Amplified Positive Resist Composition and Patterning Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-04-27 US disclosed
US-20170038684-A1 Chemically Amplified Positive Resist Composition and Pattern Forming Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-02-09 US disclosed
EP-3128368-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERN FORMING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2017-02-08 EP disclosed
US-8980525-B2 Chemically amplified positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-03-17 US disclosed
US-20130026044-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-31 US disclosed
EP-2551722-A1 Chemically amplified positive resist composition and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2013-01-30 EP disclosed