SCHEMBL149923

SCHEMBL149923

Cn1nnnc1N

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Hydrochloric Acid SCHEMBL28854155 0.97
SCHEMBL2342296 0.97
SCHEMBL2163916 0.67
SCHEMBL75716 0.67
SCHEMBL507708 0.67
SCHEMBL18496466 0.66 CYP1A2 (0.57)
SCHEMBL4407943 0.65
SCHEMBL96698 0.65
SCHEMBL19559685 0.65
SCHEMBL28681113 0.65

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 896 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12492340-B2 Etchant SAMSUNG DISPLAY CO., LTD. (KR) 2025-12-09 US claimed
US-12384967-B2 Etchant SAMSUNG DISPLAY CO., LTD. (KR) 2025-08-12 US claimed
CN-119223101-A Environment-friendly airport bird repellent bomb 中北大学 2024-12-31 CN claimed
CN-114381733-B Etching solution composition and method for manufacturing array substrate for display device using same 东友精细化工有限公司 2024-11-08 CN claimed
CN-118598854-A Small molecular compound with high HPPD (high-pressure sensitive PD) inhibitory activity and synthesis method thereof 上海冰鉴信息科技有限公司 2024-09-06 CN claimed
CN-118516673-A MTD-Cu-MTD etching solution and etching method 湖北兴福电子材料股份有限公司 2024-08-20 CN claimed
CN-117903802-A Polysilicon etching solution and application 湖北兴福电子材料股份有限公司 2024-04-19 CN claimed
CN-117904633-A Copper-free aluminum etching solution 江苏艾森半导体材料股份有限公司 2024-04-19 CN claimed
CN-117758104-A Copper-molybdenum alloy wire for electronic device, manganese plating process and manganese plating solution thereof 余姚市爱迪升电镀科技有限公司 2024-03-26 CN claimed
CN-117590708-A Dry film removing liquid and preparation method and application thereof 江苏艾森半导体材料股份有限公司 2024-02-23 CN claimed
US-20050097825-A1 Compositions and methods for a barrier removal ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 2005-05-12 US claimed
CN-1451031-A Method for roughening copper surfaces for bonding to substrates ELECTROCHEMICALS INC (US) 2003-10-22 CN claimed
JP-2003519286-A 2003-06-17 JP claimed
EP-1255797-A1 METHOD FOR ROUGHENING COPPER SURFACES FOR BONDING TO SUBSTRATES ELECTROCHEMICALS INC. (US) 2002-11-13 EP claimed
WO-2001049805-A1 METHOD FOR ROUGHENING COPPER SURFACES FOR BONDING TO SUBSTRATES ELECTROCHEMICALS INC. (US) 2001-07-12 WO claimed
CN-1209468-A Micro-etching agent for copper and copper alloy MIKEDO K K (JP) 1999-03-03 CN claimed
EP-0890660-A1 Microetching agent for copper or copper alloys MEC CO., Ltd. (JP) 1999-01-13 EP claimed
US-4629679-A ENHANCED ADHESION TO METAL SURFACES; PRINTED CIRCUITS MITSUBISHI RAYON COMPANY LTD. (JP) 1986-12-16 US claimed
US-4248868-A FOR TREATING SYSTEMIC INFECTIONS BY GRAMPOSITIVE AND GRAM NEGATIVE BACTERIA CIBA-GEIGY CORPORATION (US) 1981-02-03 US claimed
US-3948703-A Method of chemically polishing copper and copper alloy TOKAI DENKA KOGYO KABUSHIKI KAISHA (JA) 1976-04-06 US claimed