SCHEMBL1618596

SCHEMBL1618596

NNC(=O)O.[Cu]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7258925 0.95 TSHR (0.54)
SCHEMBL7898 0.95
SCHEMBL28163723 0.92
SCHEMBL27852089 0.91
Ammonia Solution, Strong SCHEMBL20639246 0.91
SCHEMBL28205496 0.91
SCHEMBL28803623 0.91
Water SCHEMBL9312726 0.91
Hydrochloric Acid SCHEMBL3403342 0.91
Hydrazine SCHEMBL14118554 0.91

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 19 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1500978-B1 Photosensitive metal nanoparticle and method of forming conductive pattern using the same SAMSUNG ELECTRONICS CO LTD (KR) 2014-04-23 EP disclosed
US-8481161-B2 Functionalized metal nanoparticle and method for formation of conductive pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2013-07-09 US disclosed
CN-101563786-B Electronic device module comprising polyolefin copolymer DOW GLOBAL TECHNOLOGIES INC 2011-08-17 CN disclosed
CN-101517750-B Electronic device module comprising ethylene multi-block copolymer DOW GLOBAL TECHNOLOGIES INC 2011-06-29 CN disclosed
US-7923110-B2 Metal nanoparticle having a self-assembled monolayer on its surface, and formation of conductive pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2011-04-12 US disclosed
CN-1573543-B Photosensitive metal nanoparticle and method of forming conductive pattern using the same SAMSUNG ELECTRONICS CO LTD 2010-05-12 CN disclosed
CN-101563786-A Electronic device module comprising polyolefin copolymer DOW GLOBAL TECHNOLOGIES INC (US) 2009-10-21 CN disclosed
CN-101517750-A Electronic device module comprising ethylene multi-block copolymer DOW GLOBAL TECHNOLOGIES INC (US) 2009-08-26 CN disclosed
US-7473513-B1 Photosensitive metal nanoparticle and method of forming conductive pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2009-01-06 US disclosed
US-20080311513-A1 PHOTOSENSITIVE METAL NANOPARTICLE AND METHOD OF FORMING CONDUCTIVE PATTERN USING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2008-12-18 US disclosed
US-20080020317-A1 Novel metal nanoparticle and formation of conductive pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2008-01-24 US disclosed
US-20080003363-A1 Novel metal nanoparticle and method for formation of conductive pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2008-01-03 US disclosed
US-7166412-B2 Photosensitive metal nanoparticle and method of forming conductive pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-01-23 US disclosed
CN-1573543-A Photosensitive metal nanoparticle and method of forming conductive pattern using the same SAMSUNG ELECTRONICS CO LTD (KR) 2005-02-02 CN disclosed
EP-1500978-A2 Photosensitive metal nanoparticle and method of forming conductive pattern using the same Samsung Electronics Co., Ltd. (KR) 2005-01-26 EP disclosed
US-20040253536-A1 Photosensitive metal nanoparticle and method of forming conductive pattern using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2004-12-16 US disclosed
US-6774036-B2 Integrated circuit trenched features and method of producing same GOLDSTEIN AVERY N (US) 2004-08-10 US disclosed
US-20040023488-A1 Integrated circuit trenched features and method of producing same GOLDSTEIN AVERY N (US) 2004-02-05 US disclosed
US-20020006723-A1 Integrated circuit trenched features and method of producing same NANOSPIN SOLUTIONS 2002-01-17 US disclosed