SCHEMBL16902876

SCHEMBL16902876

OCc1cccc(OCCCCOc2cccc(CO)c2)c1

nearest known ligand 0.54

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.54
SMN1; SMN2 Q16637 1/20 0.54
GPBAR1 Q8TDU6 1/20 0.54
CYSLTR1 Q9Y271 1/20 0.54
PRSS1 P07477 7/20 0.50
POLB P06746 1/20 0.49
CYP4F2 P78329 1/20 0.49
CYP4A11 Q02928 1/20 0.49
KCNA3 P22001 1/20 0.48
GGPS1 O95749 2/20 0.48
MAPK1 P28482 1/20 0.48
L3MBTL1 Q9Y468 1/20 0.48
KDM4E B2RXH2 1/20 0.47
ALDH1A1 P00352 1/20 0.47

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16902886 0.98 TSHR (0.53) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1
SCHEMBL16902887 0.98 TSHR (0.53) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1
SCHEMBL16902881 0.98 TSHR (0.53) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1
SCHEMBL16902884 0.98 TSHR (0.53) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1
SCHEMBL16902896 0.98 TSHR (0.53) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1
SCHEMBL7254533 0.98 TSHR (0.53) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1
SCHEMBL16902889 0.98 TSHR (0.53) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1
SCHEMBL16902882 0.98 TSHR (0.53) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1
SCHEMBL16902899 0.98 TSHR (0.53) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1
SCHEMBL10602833 0.96 TSHR (0.54) TSHRSMN1; SMN2GPBAR1CYSLTR1PRSS1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9310681-B2 Negative resist composition and patterning process using same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-04-12 US disclosed
US-9310681-B2 Negative resist composition and patterning process using same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-04-12 US disclosed
US-20150198883-A1 NEGATIVE RESIST COMPOSITION AND PATTERNING PROCESS USING SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-16 US disclosed
US-20150198883-A1 NEGATIVE RESIST COMPOSITION AND PATTERNING PROCESS USING SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-16 US disclosed