SCHEMBL1704488

SCHEMBL1704488

CCSCC(C)CC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL22043072 0.94
SCHEMBL4498987 0.87 TSHR (0.33)
SCHEMBL23127823 0.79
SCHEMBL14781394 0.77
SCHEMBL7968694 0.77
SCHEMBL7582442 0.77
SCHEMBL1885347 0.77
SCHEMBL21180432 0.77
SCHEMBL1705404 0.77
SCHEMBL7968691 0.77

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 23 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-3659999-B1 METHOD FOR PRODUCING POLYTHIOL COMPOUND, METHOD FOR PRODUCING CURABLE COMPOSITION, AND METHOD FOR PRODUCING CURED MATERIAL HOYA LENS THAILAND LTD (TH) 2022-04-27 EP disclosed
EP-3257916-B1 LIQUID CRYSTALLINE MEDIUM MERCK PATENT GMBH (DE) 2021-11-17 EP disclosed
EP-3660130-B1 LIQUID CRYSTAL DISPLAYS AND LIQUID CRYSTALLINE MEDIA WITH HOMEOTROPIC ALIGNMENT MERCK PATENT GMBH (DE) 2021-08-04 EP disclosed
EP-3235894-B1 LIQUID CRYSTALLINE MEDIUM MERCK PATENT GMBH (DE) 2020-12-23 EP disclosed
EP-3660130-A1 LIQUID CRYSTAL DISPLAYS AND LIQUID CRYSTALLINE MEDIA WITH HOMEOTROPIC ALIGNMENT Merck Patent GmbH (DE) 2020-06-03 EP disclosed
EP-2271622-B1 Heteroaryl derivatives as CFTR Modulators VERTEX PHARMA (US) 2017-10-04 EP disclosed
EP-2691490-B1 LIQUID CRYSTALLINE MEDIUM MERCK PATENT GMBH (DE) 2017-07-26 EP disclosed
EP-2937401-B1 LIQUID CRYSTALLINE MEDIUM MERCK PATENT GMBH (DE) 2017-04-05 EP disclosed
US-20160333277-A1 METHOD FOR REMOVING SULFUR COMPOUNDS FROM HYDROCARBON STREAMS BASF SE (DE) 2016-11-17 US disclosed
EP-3092288-A1 METHOD FOR REMOVING SULFUR COMPOUNDS FROM HYDROCARBON STREAMS BASF SE (DE) 2016-11-16 EP disclosed
US-20120136175-A1 PROCESS FOR PREPARATION OF ALKYL SULFONE COMPOUNDS SUMITOMO SEIKA CHEMICALS CO., LTD. (JP) 2012-05-31 US disclosed
EP-2441751-A1 PROCESS FOR PREPARATION OF ALKYL SULFONE COMPOUNDS Sumitomo Seika Chemicals CO. LTD. (JP) 2012-04-18 EP disclosed
US-8049042-B2 Resist polymer, resist composition, process for pattern formation, and starting compounds for production of the resist polymer MITSUBISHI RAYON CO., LTD. (JP) 2011-11-01 US disclosed
US-8049042-B2 Resist polymer, resist composition, process for pattern formation, and starting compounds for production of the resist polymer MITSUBISHI RAYON CO., LTD. (JP) 2011-11-01 US disclosed
US-20110144295-A1 RESIST POLYMER, RESIST COMPOSITION, PROCESS FOR PATTERN FORMATION, AND STARTING COMPOUNDS FOR PRODUCTION OF THE RESIST POLYMER MITSUBISHI RAYON CO., LTD. (JP) 2011-06-16 US disclosed
US-20110144295-A1 RESIST POLYMER, RESIST COMPOSITION, PROCESS FOR PATTERN FORMATION, AND STARTING COMPOUNDS FOR PRODUCTION OF THE RESIST POLYMER MITSUBISHI RAYON CO., LTD. (JP) 2011-06-16 US disclosed
US-20090198065-A1 RESIST POLYMER, RESIST COMPOSITION, PROCESS FOR PATTERN FORMATION, AND STARTING COMPOUNDS FOR PRODUCTION OF THE RESIST POLYMER MITSUBISHI RAYON CO., LTD. (JP) 2009-08-06 US disclosed
US-20090198065-A1 RESIST POLYMER, RESIST COMPOSITION, PROCESS FOR PATTERN FORMATION, AND STARTING COMPOUNDS FOR PRODUCTION OF THE RESIST POLYMER MITSUBISHI RAYON CO., LTD. (JP) 2009-08-06 US disclosed
US-20070190449-A1 Resist polymer, resist composition, process for pattern formation, and starting compounds for production of the resist polymer MITSUBISHI RAYON CO., LTD. (JP) 2007-08-16 US disclosed
US-20070190449-A1 Resist polymer, resist composition, process for pattern formation, and starting compounds for production of the resist polymer MITSUBISHI RAYON CO., LTD. (JP) 2007-08-16 US disclosed