SCHEMBL1715366

SCHEMBL1715366

O=C1CC(=O)N(CC2CO2)C(=O)N1CC1CO1

nearest known ligand 0.52

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TP53 P04637 1/20 0.52
HBB P68871 1/20 0.52
SMN1; SMN2 Q16637 1/20 0.52
DHFR P00374 1/20 0.38
MEN1 O00255 3/20 0.36
KMT2A Q03164 3/20 0.36
MAPT P10636 3/20 0.36
USP2 O75604 2/20 0.36
GAA P10253 1/20 0.36
HTT P42858 1/20 0.36
HSD17B10 Q99714 1/20 0.36
L3MBTL1 Q9Y468 1/20 0.36
RECQL P46063 2/20 0.33
ALDH1A1 P00352 1/20 0.33
POLB P06746 2/20 0.33
KDM4E B2RXH2 1/20 0.33
BLM P54132 1/20 0.33
CYP1A2 P05177 1/20 0.32
CYP2C9 P11712 1/20 0.32
CYP2C19 P33261 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL21119007 0.89 TP53 (0.64) TP53HBBSMN1; SMN2DHFRMEN1
SCHEMBL21119006 0.89 TP53 (0.64) TP53HBBSMN1; SMN2DHFRMEN1
SCHEMBL25572332 0.85 SMN1; SMN2 (0.39) TP53HBBSMN1; SMN2MEN1KMT2A
SCHEMBL6454276 0.82 TP53 (0.56) TP53HBBSMN1; SMN2DHFRMEN1
SCHEMBL25999178 0.80 TP53 (0.45) TP53HBBSMN1; SMN2DHFRMEN1
SCHEMBL15081911 0.79 MEN1 (0.42) TP53HBBSMN1; SMN2MEN1KMT2A
SCHEMBL13867767 0.78 TP53 (0.52) TP53HBBSMN1; SMN2DHFRMEN1
SCHEMBL133910 0.78 TP53 (0.47) TP53HBBSMN1; SMN2DHFRMEN1
SCHEMBL14598531 0.77 TP53 (0.42) TP53HBBSMN1; SMN2DHFR
SCHEMBL964091 0.77 SMN1; SMN2 (0.56) TP53HBBSMN1; SMN2DHFRMEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 60 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1757986-B1 ANTIREFLECTION FILM FOR SEMICONDUCTOR CONTAINING CONDENSATION TYPE POLYMER AND METHOD FOR FORMING PHOTORESIST PATTERN NISSAN CHEMICAL IND LTD (JP) 2014-05-14 EP claimed
US-7790356-B2 Condensation type polymer-containing anti-reflective coating for semiconductor NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2010-09-07 US claimed
US-20080038678-A1 Condensation Type Polymer-Containing Anti-Reflective Coating For Semiconductor NISSAN CHEMICAL INDUSTRIES LTD. (JP) 2008-02-14 US claimed
EP-1757986-A1 ANTIREFLECTION FILM FOR SEMICONDUCTOR CONTAINING CONDENSATION TYPE POLYMER Nissan Chemical Industries, Ltd. (JP) 2007-02-28 EP claimed
CN-122095316-A Composition for forming resist underlayer film 2026-05-26 CN disclosed
WO-2025095106-A1 RESIST UNDERLAYER FILM FORMATION COMPOSITION 日産化学株式会社 2025-05-08 WO disclosed
CN-114746468-B Method for producing polymer 日产化学株式会社 2024-09-13 CN disclosed
US-12044968-B2 Protective film-forming composition having acetal structure and amide structure NISSAN CHEMICAL CORPORATION (JP) 2024-07-23 US disclosed
US-12044968-B2 Protective film-forming composition having acetal structure and amide structure NISSAN CHEMICAL CORPORATION (JP) 2024-07-23 US disclosed
US-11768436-B2 Protective film forming composition having a diol structure NISSAN CHEMICAL CORPORATION (JP) 2023-09-26 US disclosed
US-11768436-B2 Protective film forming composition having a diol structure NISSAN CHEMICAL CORPORATION (JP) 2023-09-26 US disclosed
US-20230103242-A1 METHOD FOR PRODUCING POLYMER NISSAN CHEMICAL CORPORATION (JP) 2023-03-30 US disclosed
CN-101160549-A Composition comprising polymer having ethylene-dicarbonyl structure for use in forming anti-reflective coating for lithography NISSAN CHEMICAL IND LTD (JP) 2008-04-09 CN disclosed
US-20080038678-A1 Condensation Type Polymer-Containing Anti-Reflective Coating For Semiconductor NISSAN CHEMICAL INDUSTRIES LTD. (JP) 2008-02-14 US disclosed
EP-1876495-A1 COMPOSITION COMPRISING POLYMER HAVING ETHYLENE-DICARBONYL STRUCTURE FOR USE IN FORMING ANTI-REFLECTIVE COATING FOR LITHOGRAPHY Nissan Chemical Industries, Ltd. (JP) 2008-01-09 EP disclosed
US-20080003524-A1 Sulfonate-Containing Anti-Reflective Coating Forming Composition for Lithography NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2008-01-03 US disclosed
EP-1813987-A1 SULFONIC-ESTER-CONTAINING COMPOSITION FOR FORMATION OF ANTIREFLECTION FILM FOR LITHOGRAPHY Nissan Chemical Industries, Ltd. (JP) 2007-08-01 EP disclosed
EP-1757986-A1 ANTIREFLECTION FILM FOR SEMICONDUCTOR CONTAINING CONDENSATION TYPE POLYMER Nissan Chemical Industries, Ltd. (JP) 2007-02-28 EP disclosed
US-4459392-A Method of making and polymer of heat resistant polyester using diglycidilhydantoins, diglycidiluracils, diglycidilbarbituric and isocyanuric acids UNITIKA LIMITED (JP) 1984-07-10 US disclosed
US-4117029-A VINYL CHLORIDE POLYE NITTO KASEI CO. LTD. (JP) 1978-09-26 US disclosed