⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL170121 | 0.56 | — | — | |
| SCHEMBL454128 | 0.56 | — | — | |
| SCHEMBL3128789 | 0.56 | — | — | |
| SCHEMBL793135 | 0.56 | — | — | |
| SCHEMBL12925305 | 0.56 | — | — | |
| SCHEMBL1803940 | 0.56 | — | — | |
| SCHEMBL1207072 | 0.56 | — | — | |
| SCHEMBL2439268 | 0.56 | — | — | |
| SCHEMBL3128795 | 0.56 | — | — | |
| SCHEMBL4613608 | 0.54 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-8450931-B2 | Process for minimizing electromigration in an electronic device | DOW CORNING CORPORATION (US) | 2013-05-28 | — | — | US | claimed |
| EP-1880416-B1 | PROCESS FOR MINIMIZING ELECTROMIGRATION IN AN ELECTRONIC DEVICE | DOW CORNING (US) | 2012-01-18 | — | — | EP | claimed |
| US-20080054806-A1 | Process for Minimizing Electromigration in an Electronic Device | DOW CORNING CORPORATION | 2008-03-06 | — | — | US | claimed |
| US-8450931-B2 | Process for minimizing electromigration in an electronic device | DOW CORNING CORPORATION (US) | 2013-05-28 | — | — | US | disclosed |
| US-20080054806-A1 | Process for Minimizing Electromigration in an Electronic Device | DOW CORNING CORPORATION | 2008-03-06 | — | — | US | disclosed |
| EP-1880416-A1 | PROCESS FOR MINIMIZING ELECTROMIGRATION IN AN ELECTRONIC DEVICE | Dow Corning Corporation (US) | 2008-01-23 | — | — | EP | disclosed |
| WO-2006122025-A1 | PROCESS FOR MINIMIZING ELECTROMIGRATION IN AN ELECTRONIC DEVICE | DOW CORNING CORPORATION (US) | 2006-11-16 | — | — | WO | disclosed |
| EP-1032038-A2 | Conductive and resitive material with electrical stability for use in electronics devices | National Starch and Chemical Investment Holding Corporation (US) | 2000-08-30 | — | — | EP | disclosed |