SCHEMBL17890374

SCHEMBL17890374

[CH2][CH]CF

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2514572 0.67
SCHEMBL2514570 0.67
SCHEMBL36456 0.67
Water SCHEMBL15412681 0.63
SCHEMBL6680699 0.63
Hydrochloric Acid SCHEMBL7206471 0.63
SCHEMBL3421119 0.63
Ammonia Solution, Strong SCHEMBL9647 0.63
SCHEMBL1060118 0.63
Phosphine SCHEMBL15013438 0.63

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-109563243-B Fluorine atom-containing polymer and use thereof 日产化学株式会社 2022-07-08 CN disclosed
EP-3168250-B1 FLUORINE-ATOM-CONTAINING POLYMER AND USE THEREOF NISSAN CHEMICAL CORP (JP) 2020-02-26 EP disclosed
US-10199578-B2 Fluorine-atom-containing polymer and use thereof NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2019-02-05 US disclosed
US-20170200897-A1 FLUORINE-ATOM-CONTAINING POLYMER AND USE THEREOF NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2017-07-13 US disclosed
US-9671692-B2 Compound, resin and photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-06-06 US disclosed
EP-3168250-A1 FLUORINE-ATOM-CONTAINING POLYMER AND USE THEREOF Nissan Chemical Industries, Ltd. (JP) 2017-05-17 EP disclosed
US-9575408-B2 Photoresist composition and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-02-21 US disclosed
US-20160244400-A1 COMPOUND, RESIN AND PHOTORESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-25 US disclosed
US-20160195809-A1 PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-07-07 US disclosed