SCHEMBL1836009

SCHEMBL1836009

C1=C2CCC(C1)C2.C1=CC2CCC1C2

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15663 0.84
Hydrogen Sulfide SCHEMBL7638603 0.84
SCHEMBL17144160 0.84
Methane SCHEMBL4558430 0.82
SCHEMBL8744575 0.82
SCHEMBL23199234 0.82
SCHEMBL539983 0.82
SCHEMBL6071615 0.82
SCHEMBL8773572 0.82
SCHEMBL11618219 0.82

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 35 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1614410-B1 Dental materials polymerizable by photo-induced ring-opening metathesis polymerization of cyclic olefins IVOCLAR VIVADENT AG (LI) 2011-08-10 EP disclosed
EP-1833870-B1 DURABLE COATING COMPOSITIONS CONTAINING NOVEL ASPARTIC AMINE COMPOUNDS DU PONT (US) 2011-05-11 EP disclosed
EP-1183571-B1 FLUORINATED PHOTORESISTS AND PROCESSES FOR MICROLITHOGRAPHY DU PONT (US) 2010-06-02 EP disclosed
EP-1270553-B1 Acid generator, sulfonic acid, sulfonic acid derivatives and radiation-sensitive resin composition JSR CORP (JP) 2009-11-18 EP disclosed
US-7314701-B2 Radiation-sensitive resin composition JSR CORPORATION (JP) 2008-01-01 US disclosed
US-7276323-B2 Photoresists, polymers and processes for microlithography E. I. DU PONT DE NEMOURS AND COMPANY (US) 2007-10-02 US disclosed
US-7217495-B2 Fluorinated polymers, photoresists and processes for microlithography E I. DU PONT DE NEMOURS AND COMPANY (US) 2007-05-15 US disclosed
EP-1383812-B1 POLYCYCLIC FLUORINE-CONTAINING POLYMERS AND PHOTORESISTS FOR MICROLITHOGRAPHY DU PONT (US) 2006-05-31 EP disclosed
US-7045268-B2 Polymers blends and their use in photoresist compositions for microlithography E.I. DU PONT DE NEMOURS AND COMPANY (US) 2006-05-16 US disclosed
EP-1278786-B1 COPOLYMERS FOR PHOTORESISTS AND PROCESSES THEREFOR DU PONT (US) 2006-01-04 EP disclosed
WO-2002079287-A1 POLYCYCLIC FLUORINE-CONTAINING POLYMERS AND PHOTORESISTS FOR MICROLITHOGRAPHY E. I. DU PONT DE NEMOURS AND COMPANY (US) 2002-10-10 WO disclosed
EP-1246013-A2 Photoresists, polymers and processes for microlithography E.I. DU PONT DE NEMOURS AND COMPANY (US) 2002-10-02 EP disclosed
EP-1240554-A2 NITRILE/FLUOROALCOHOL POLYMER-CONTAINING PHOTORESISTS AND ASSOCIATED PROCESSES FOR MICROLITHOGRAPHY E.I. DU PONT DE NEMOURS AND COMPANY (US) 2002-09-18 EP disclosed
WO-2002044811-A2 POLYMERS BLENDS AND THEIR USE IN PHOTORESIST COMPOSITIONS FOR MICROLITHOGRAPHY E. I. DU PONT DE NEMOURS AND COMPANY (US) 2002-06-06 WO disclosed
WO-2002044814-A2 PHOTORESIST COMPOSITIONS COMPRISING BASES AND SURFACTANTS FOR MICROLITHOGRAPHY E. I. DU PONT DE NEMOURS AND COMPANY (US) 2002-06-06 WO disclosed
WO-2001085811-A2 COPOLYMERS FOR PHOTORESISTS AND PROCESSES THEREFOR E.I. DU PONT DE NEMOURS AND COMPANY (US) 2001-11-15 WO disclosed
EP-1131677-A1 PHOTORESISTS, POLYMERS AND PROCESSES FOR MICROLITHOGRAPHY E.I. DUPONT DE NEMOURS AND COMPANY (US) 2001-09-12 EP disclosed
WO-2001037047-A2 NITRILE/FLUOROALCOHOL POLYMER-CONTAINING PHOTORESISTS AND ASSOCIATED PROCESSES FOR MICROLITHOGRAPHY E.I. DU PONT DE NEMOURS AND COMPANY (US) 2001-05-25 WO disclosed
WO-2000017712-A1 PHOTORESISTS, POLYMERS AND PROCESSES FOR MICROLITHOGRAPHY E.I. DU PONT DE NEMOURS AND COMPANY (US) 2000-03-30 WO disclosed
US-4059561-A AND A HALOGEN COMPOUND SHOWA DENKO KABUSHIKI KAISHA (JA) 1977-11-22 US disclosed