SCHEMBL19756032

SCHEMBL19756032

O=C(OC1CCCC(C(=O)OC(CS(=O)(=O)O)C(F)(F)F)C1)c1cc(I)cc(I)c1I

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19756052 0.92 — —
SCHEMBL19756007 0.89 — —
SCHEMBL19756039 0.84 — —
SCHEMBL19756182 0.79 SERPINE1 (0.32) —
SCHEMBL19756006 0.79 — —
SCHEMBL19756025 0.79 — —
SCHEMBL19755966 0.79 HDAC3 (0.32) —
SCHEMBL25527888 0.78 — —
SCHEMBL19756035 0.78 — —
SCHEMBL25476163 0.78 — —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230384676-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD OF FORMING PATTERN, POLYMER, AND COMPOUND JSR CORPORATION (JP) 2023-11-30 — — US disclosed
US-20230273519-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMATION METHOD JSR CORPORATION (JP) 2023-08-31 — — US disclosed
US-20170369616-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-12-28 — — US disclosed
Send feedback