SCHEMBL21701055

SCHEMBL21701055

CC1CC2CCCC(CCC(F)S(=O)(=O)O)(C1)C2

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL18431954 0.80 CYP1A2 (0.30)
SCHEMBL19325466 0.77
SCHEMBL26603975 0.77
SCHEMBL21396819 0.77 EPHX2 (0.42)
SCHEMBL15293054 0.76 CYP1A2 (0.32)
SCHEMBL18607984 0.76 CYP1A2 (0.34)
SCHEMBL18649749 0.75 GRIN2D (0.34)
SCHEMBL23206979 0.74 EPHX2 (0.40)
SCHEMBL20013683 0.74
SCHEMBL18485238 0.74

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230221640-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2023-07-13 US disclosed
US-20210200098-A1 PATTERN FORMING METHOD AND RESIST LAMINATE FOR ORGANIC SOLVENT DEVELOPMENT FUJIFILM CORPORATION (JP) 2021-07-01 US disclosed
US-20200050106-A1 PHOTOSENSITIVE COMPOSITION FOR EUV LIGHT, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2020-02-13 US disclosed