SCHEMBL2745405

SCHEMBL2745405

[As-3].[Ga+3].[Ga+3].[In].[In].[SbH6-3]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7167007 0.89
SCHEMBL2745571 0.89
SCHEMBL700143 0.87
SCHEMBL49427 0.87
SCHEMBL7263528 0.75
SCHEMBL7162106 0.75
SCHEMBL6250778 0.75
SCHEMBL8035334 0.75
SCHEMBL9303057 0.75
SCHEMBL6374443 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 11 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8178863-B2 Lateral collection architecture for SLS detectors TELEDYNE SCIENTIFIC & IMAGING, LLC (US) 2012-05-15 US claimed
US-20100301309-A1 LATERAL COLLECTION ARCHITECTURE FOR SLS DETECTORS TELEDYNE SCIENTIFIC & IMAGING, LLC 2010-12-02 US claimed
US-8697554-B2 Lateral collection architecture for SLS detectors TELEDYNE SCIENTIFIC & IMAGING, LLC (US) 2014-04-15 US disclosed
US-8178863-B2 Lateral collection architecture for SLS detectors TELEDYNE SCIENTIFIC & IMAGING, LLC (US) 2012-05-15 US disclosed
US-20100301309-A1 LATERAL COLLECTION ARCHITECTURE FOR SLS DETECTORS TELEDYNE SCIENTIFIC & IMAGING, LLC 2010-12-02 US disclosed
US-7684887-B2 Advanced process control method and advanced process control system for acquiring production data in a chip production installation INFINEON TECHNOLOGIES AG (DE) 2010-03-23 US disclosed
US-7016750-B2 Method, device, computer-readable storage medium and computer program element for monitoring of a manufacturing process INFINEON TECHNOLOGIES AG (DE) 2006-03-21 US disclosed
US-6909933-B2 Method, device, computer-readable memory and computer program element for the computer-aided monitoring and controlling of a manufacturing process INFINEON TECHNOLOGIES AG (DE) 2005-06-21 US disclosed
US-20040236528-A1 Method, device, computer-readable storage medium and computer program element for monitoring of a manufacturing process INFINEON TECHNOLOGIES AG (DE) 2004-11-25 US disclosed
US-20040225396-A1 Method, device, computer-readable memory and computer program element for the computer-aided monitoring and controlling of a manufacturing process INFINEON TECHNOLOGIES AG (DE) 2004-11-11 US disclosed
US-20040220688-A1 Advanced process control method and advanced process control system for acquiring production data in a chip production installation INFINEON TECHNOLOGIES AG (DE) 2004-11-04 US disclosed