SCHEMBL2909316

SCHEMBL2909316

O=C1OS(=O)(=O)O1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3219257 0.67 TSHR (0.44)
SCHEMBL31229120 0.65 TSHR (0.42)
Potassium SCHEMBL31228960 0.65 TSHR (0.42)
SCHEMBL10934187 0.64
SCHEMBL239146 0.64
SCHEMBL576137 0.63
Lithium SCHEMBL30887897 0.62
SCHEMBL31620243 0.58 ABCG2 (0.36)
Cyclohexane SCHEMBL10738519 0.56 TSHR (0.33)
SCHEMBL31257821 0.55

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 43 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10453699-B2 Etching method and etching apparatus TOKYO ELECTRON LIMITED (JP) 2019-10-22 US claimed
US-20150004795-A1 PLASMA ETCHING METHOD AND PLASMA ETCHING APPARATUS TOKYO ELECTRON LIMITED (JP) 2015-01-01 US claimed
EP-2819151-A1 Plasma etching method and plasma etching apparatus TOKYO ELECTRON LIMITED (JP) 2014-12-31 EP claimed
CN-116209542-A Silicon oxide-based slurry for selective polishing of carbon-based films CMC材料股份有限公司 2023-06-02 CN disclosed
US-20230058079-A1 ETCHING METHOD, PLASMA PROCESSING APPARATUS, AND SUBSTRATE PROCESSING SYSTEM TOKYO ELECTRON LIMITED (JP) 2023-02-23 US disclosed
US-11476123-B2 Etching method, plasma processing apparatus, and substrate processing system TOKYO ELECTRON LIMITED (JP) 2022-10-18 US disclosed
CN-110868861-B Agricultural compositions 萨卡帕·瓦达卡库塔 2022-03-15 CN disclosed
CN-113912525-A Probe for modifying protein cysteine residue and preparation method thereof 深圳湾实验室坪山生物医药研发转化中心 2022-01-11 CN disclosed
US-20210082713-A1 ETCHING METHOD, PLASMA PROCESSING APPARATUS, AND SUBSTRATE PROCESSING SYSTEM TOKYO ELECTRON LIMITED (JP) 2021-03-18 US disclosed
US-10566089-B1 Nanosensor array for medical diagnoses UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA (US) 2020-02-18 US disclosed
US-10453699-B2 Etching method and etching apparatus TOKYO ELECTRON LIMITED (JP) 2019-10-22 US disclosed
EP-0900252-B1 POLYOLEFINE MATERIALS WITH IMPROVED ADHESIVITY COGNIS DEUTSCHLAND GMBH (DE) 2002-12-04 EP disclosed
EP-0900252-A1 POLYOLEFINE MATERIALS WITH IMPROVED ADHESIVITY Henkel Kommanditgesellschaft auf Aktien (DE) 1999-03-10 EP disclosed
CN-1175570-A Method and catalyst of synthesis of methyl glycolate CHENGDU ORGANIC CHEM INST (CN) 1998-03-11 CN disclosed
WO-1997044386-A1 POLYOLEFINE MATERIALS WITH IMPROVED ADHESIVITY HENKEL KOMMANDITGESELLSCHAFT AUF AKTIEN (DE) 1997-11-27 WO disclosed
EP-0282814-A2 Colour photographic recording material for the diffusion transfer process Agfa-Gevaert AG (DE) 1988-09-21 EP disclosed
EP-0049399-B1 PROCESS FOR PRODUCING DISPERSIONS OF HYDROPHOBIC COLOUR COUPLERS IN WATER, AND USE OF THESE DISPERSIONS IN PRODUCING LIGHT-SENSITIVE REPRODUCTION MATERIALS Agfa-Gevaert AG (DE) 1986-09-10 EP disclosed
EP-0049399-A2 Process for producing dispersions of hydrophobic colour couplers in water, and use of these dispersions in producing light-sensitive reproduction materials Agfa-Gevaert AG (DE) 1982-04-14 EP disclosed
EP-0005804-B1 PHOTOGRAPHIC MATERIALS, PROCESS FOR THEIR PREPARATION AS WELL AS THE PRODUCTION OF PHOTOGRAPHIC IMAGES AND THIOETHERS Agfa-Gevaert AG (DE) 1980-11-26 EP disclosed
EP-0005804-A1 Photographic materials, process for their preparation as well as the production of photographic images and thioethers Agfa-Gevaert AG (DE) 1979-12-12 EP disclosed