⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL296862 | 0.87 | — | — | |
| SCHEMBL27509900 | 0.87 | — | — | |
| SCHEMBL28095459 | 0.82 | — | — | |
| SCHEMBL27350979 | 0.82 | — | — | |
| SCHEMBL11070409 | 0.82 | — | — | |
| SCHEMBL27727353 | 0.82 | — | — | |
| SCHEMBL160387 | 0.82 | — | — | |
| SCHEMBL2935108 | 0.82 | — | — | |
| SCHEMBL5840167 | 0.67 | — | — | |
| SCHEMBL8026808 | 0.67 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 24 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-8216370-B2 | Method for reducing defect concentration in crystals | MOMENTIVE PERFORMANCE MATERIALS INC. (US) | 2012-07-10 | — | — | US | claimed |
| EP-1715086-B1 | Method for reducing defect concentrations in crystals | GEN ELECTRIC (US) | 2012-03-14 | — | — | EP | claimed |
| EP-1378591-B1 | Method for removing defects in crystals | DIAMOND INNOVATIONS INC (US) | 2009-03-25 | — | — | EP | claimed |
| US-7175704-B2 | Method for reducing defect concentrations in crystals | DIAMOND INNOVATIONS, INC. (US) | 2007-02-13 | — | — | US | claimed |
| EP-1715086-A1 | Method for reducing defect concentrations in crystals | GENERAL ELECTRIC COMPANY (US) | 2006-10-25 | — | — | EP | claimed |
| US-20060096521-A1 | Method for reducing defect concentration in crystals | MOMENTIVE PERFORMANCE MATERIALS INC. | 2006-05-11 | — | — | US | claimed |
| EP-1378591-A1 | Method for removing defects in crystals | General Electric Company (US) | 2004-01-07 | — | — | EP | claimed |
| US-20040000266-A1 | Method for reducing defect concentrations in crystals | Diamond Innovations, Inc | 2004-01-01 | — | — | US | claimed |
| CN-103346228-B | Semiconductor device with a plurality of semiconductor chips | 晶元光电股份有限公司 | 2017-06-13 | — | — | CN | disclosed |
| CN-103346228-A | Semiconductor device | HUGA OPTOTECH INC | 2013-10-09 | — | — | CN | disclosed |
| CN-102201510-B | Semiconductor device with a plurality of semiconductor chips | HUGA OPTOTECH INC | 2013-07-24 | — | — | CN | disclosed |
| WO-2013043809-A2 | HETEROSTRUCTURE SI SOLAR CELLS USING WIDE-BANDGAP SEMICONDUCTORS | ARIZONA BOARD OF REGENTS, A BODY CORPORATE OF THE STATE OF ARIZONA (US) | 2013-03-28 | — | — | WO | disclosed |
| CN-102074620-B | Semiconductor light emitting element | HUGA OPTOTECH INC | 2012-07-25 | — | — | CN | disclosed |
| US-8216370-B2 | Method for reducing defect concentration in crystals | MOMENTIVE PERFORMANCE MATERIALS INC. (US) | 2012-07-10 | — | — | US | disclosed |
| US-7175704-B2 | Method for reducing defect concentrations in crystals | DIAMOND INNOVATIONS, INC. (US) | 2007-02-13 | — | — | US | disclosed |
| EP-1715086-A1 | Method for reducing defect concentrations in crystals | GENERAL ELECTRIC COMPANY (US) | 2006-10-25 | — | — | EP | disclosed |
| US-20060096521-A1 | Method for reducing defect concentration in crystals | MOMENTIVE PERFORMANCE MATERIALS INC. | 2006-05-11 | — | — | US | disclosed |
| EP-1378591-A1 | Method for removing defects in crystals | General Electric Company (US) | 2004-01-07 | — | — | EP | disclosed |
| US-20040000266-A1 | Method for reducing defect concentrations in crystals | Diamond Innovations, Inc | 2004-01-01 | — | — | US | disclosed |
| CN-1223022-A | Beryllium-containing II-VI blue-green laser diode | MINNESOTA MINING & MFG (US) | 1999-07-14 | — | — | CN | disclosed |