SCHEMBL297861

SCHEMBL297861

CO[Si](C)(C)O[Si](C)(C)OC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2201629 0.96
SCHEMBL297308 0.96
SCHEMBL7794435 0.96
SCHEMBL4547753 0.86
SCHEMBL42200 0.86
SCHEMBL4547755 0.86
SCHEMBL13448867 0.86
SCHEMBL13232694 0.86
SCHEMBL768193 0.86
SCHEMBL13838896 0.86

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 750 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12512313-B2 Method of forming low-k material layer with high-frequency power, structure including the layer, and system for forming same ASM IP HOLDING B.V. (NL) 2025-12-30 US claimed
WO-2025264567-A1 LOW-K FILM COEFFICIENT OF THERMAL EXPANSION MODULATION BY UV TREATMENT APPLIED MATERIALS, INC. (US) 2025-12-26 WO claimed
US-20250391656-A1 LOW-K FILM COEFFICIENT OF THERMAL EXPANSION MODULATION BY UV TREATMENT APPLIED MATERIALS INC (US) 2025-12-25 US claimed
US-20250357107-A1 RF PULSING ASSISTED LOW-K MATERIAL DEPOSITION WITH HIGH DENSITY APPLIED MATERIALS, INC. (US) 2025-11-20 US claimed
US-20250343032-A1 SUBSTRATE PROCESSING APPARATUS WITH TEMPERATURE CONTROLLER ASM IP HOLDING BV (NL) 2025-11-06 US claimed
WO-2025049147-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-03-06 WO claimed
US-20250069884-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-02-27 US claimed
WO-2025040760-A1 COATING COMPOSITIONS MOMENTIVE PERFORMANCE MATERIALS GMBH (DE) 2025-02-27 WO claimed
WO-2025038375-A1 METHODS FOR FORMING LOW-Κ DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND INCREASED DENSITY APPLIED MATERIALS, INC. (US) 2025-02-20 WO claimed
US-20250062117-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND INCREASED DENSITY APPLIED MATERIALS, INC. (US) 2025-02-20 US claimed
US-7125488-B2 Polar-modified bonded phase materials for chromatographic separations VARIAN, INC. (US) 2006-10-24 US claimed
US-20060122351-A1 Ultraviolet transmissive polyhedral silsesquioxane polymers PANASONIC ELECTRIC WORKS CO., LTD. (JP) 2006-06-08 US claimed
US-20050178730-A1 Polar-modified bonded phase materials for chromatographic separations AGILENT TECHNOLOGIES, INC. 2005-08-18 US claimed
US-6818570-B2 Method of forming silicon-containing insulation film having low dielectric constant and high mechanical strength ASM JAPAN K.K. (JP) 2004-11-16 US claimed
US-20030176030-A1 Method of forming silicon-containing insulation film having low dielectric constant and high mechanical strength ASM JAPAN K.K. (JP) 2003-09-18 US claimed
EP-1342809-A1 Method of forming a low dialectric constant insulation film ASM JAPAN K.K. (JP) 2003-09-10 EP claimed
EP-0698632-B1 Process for preparing organosiloxane terminated with silanol group SHINETSU CHEMICAL CO (JP) 2001-11-21 EP claimed
US-5576408-A Process for preparing low molecular weight organosiloxane terminated with silanol group SHIN-ETSU CHEMICAL CO., LTD. (JP) 1996-11-19 US claimed
US-5391677-A Acrylic-functional organopolysiloxane and method for the preparation thereof SHIN-ETSU CHEMICAL CO., LTD. (JP) 1995-02-21 US claimed
EP-0443860-B1 Method for preparing liquid chromatograph packing material, and material produced thereby CHEMICALS INSPECTION & TESTING (JP) 1994-02-09 EP claimed