SCHEMBL29948174

SCHEMBL29948174

O=S(=O)(O)C1(Cl)C=CC(Cl)=CC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11691446 0.67
SCHEMBL8085659 0.61
SCHEMBL28909632 0.61
SCHEMBL443212 0.51
Sulfuric Acid SCHEMBL20590500 0.50
SCHEMBL329212 0.48
Sulfuric Acid SCHEMBL29036454 0.47
Sulfuric Acid SCHEMBL27592259 0.47
Sulfuric Acid SCHEMBL28012634 0.47
Sulfuric Acid SCHEMBL27758086 0.47

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-3435158-B1 ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE COMPOSITION, METHOD FOR PURIFYING ACTIVE RAY-SENSITIVE OR RADIATION-SENSITIVE COMPOSITION, PATTERN-FORMING METHOD, AND METHOD FOR PRODUCING ELECTRONIC DEVICE FUJIFILM CORP (JP) 2025-11-19 EP disclosed
US-11460769-B2 Actinic ray-sensitive or radiation-sensitive composition, method for producing actinic ray-sensitive or radiation-sensitive composition, pattern forming method, and method for manufacturing electronic device FUJIFILM CORPORATION (JP) 2022-10-04 US disclosed