SCHEMBL3148703

SCHEMBL3148703

C[SiH](C)O[SiH2]O[SiH](C)C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14198538 0.73
SCHEMBL9706874 0.73
SCHEMBL1772372 0.71
SCHEMBL152002 0.70
SCHEMBL23501543 0.69
SCHEMBL10877829 0.67
SCHEMBL5446329 0.67
SCHEMBL1717383 0.65
Methane SCHEMBL8084960 0.65
SCHEMBL10400143 0.65

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 56 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7399697-B2 Very low dielectric constant plasma-enhanced CVD films APPLIED MATERIALS, INC. (US) 2008-07-15 US claimed
US-20050136240-A1 Very low dielectric constant plasma-enhanced CVD films MANDAL ROBERT P (US) 2005-06-23 US claimed
US-6890639-B2 Very low dielectric constant plasma-enhanced CVD films APPLIED MATERIALS, INC. (US) 2005-05-10 US claimed
US-6596627-B2 Reacting an organosilicon compound and a non-silicon compound comprising a cyclic ring at conditions sufficient to retain the ring in an intermediate dielectric layer, and converting it to a dispersed void. APPLIED MATERIALS INC. 2003-07-22 US claimed
US-6541367-B1 Plasma vapor deposition; oxidation of organosilicon compound APPLIED MATERIALS, INC. 2003-04-01 US claimed
US-20020197849-A1 Very low dielectric constant plasma-enhanced CVD films APPLIED MATERIALS, INC. 2002-12-26 US claimed
EP-1119035-A2 Method for depositing a low dielectric constant film Applied Materials, Inc. (US) 2001-07-25 EP claimed
CN-109641482-B Preparation of cis-1, 4-polydienes having multiple silane functional groups prepared by in situ hydrosilylation of polymer glues 株式会社普利司通 2021-11-05 CN disclosed
EP-3507104-A1 PRODUCTION OF CIS-1,4-POLYDIENES WITH MULTIPLE SILANE FUNCTIONAL GROUPS PREPARED BYIN-SITU Bridgestone Corporation (JP) 2019-07-10 EP disclosed
US-20190186046-A1 POROUS SURFACE FOR BIOMEDICAL DEVICES APPLIED MATERIALS INC (US) 2019-06-20 US disclosed
EP-2645375-B1 Dielectric elastomer on a fluorosilicone basis and method for producing the same FRAUNHOFER GES FORSCHUNG (DE) 2019-02-20 EP disclosed
US-10167574-B2 Porous surface for biomedical devices APPLIED MATERIALS, INC. (US) 2019-01-01 US disclosed
WO-2018045291-A1 PRODUCTION OF CIS-1,4-POLYDIENES WITH MULTIPLE SILANE FUNCTIONAL GROUPS PREPARED BY IN-SITU HYDROSILYLATION OF POLYMER CEMENT BRIDGESTONE CORPORATION (JP) 2018-03-08 WO disclosed
US-20040235291-A1 Very low dielectric constant plasma-enhanced CVD films APPLIED MATERIALS, INC. 2004-11-25 US disclosed
US-20030211728-A1 Very low dielectric constant plasma-enhanced CVD films APPLIED MATERIALS, INC. 2003-11-13 US disclosed
US-6596627-B2 Reacting an organosilicon compound and a non-silicon compound comprising a cyclic ring at conditions sufficient to retain the ring in an intermediate dielectric layer, and converting it to a dispersed void. APPLIED MATERIALS INC. 2003-07-22 US disclosed
US-6541367-B1 Plasma vapor deposition; oxidation of organosilicon compound APPLIED MATERIALS, INC. 2003-04-01 US disclosed
US-20020197849-A1 Very low dielectric constant plasma-enhanced CVD films APPLIED MATERIALS, INC. 2002-12-26 US disclosed
US-20020142585-A1 Very low dielectric constant plasma-enhanced CVD films APPLIED MATERIALS, INC. 2002-10-03 US disclosed
EP-1119035-A2 Method for depositing a low dielectric constant film Applied Materials, Inc. (US) 2001-07-25 EP disclosed