SCHEMBL321124

SCHEMBL321124

Fc1c(F)c(F)c2c(c1F)-c1c(F)c(F)c(F)c(F)c1-2

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12887874 1.00 — —
SCHEMBL3991319 0.94 — —
SCHEMBL949025 0.94 — —
SCHEMBL3991317 0.89 — —
SCHEMBL952288 0.89 — —
SCHEMBL17747947 0.89 — —
SCHEMBL14157108 0.88 — —
SCHEMBL7174935 0.88 — —
SCHEMBL14157195 0.88 — —
SCHEMBL247367 0.88 — —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 152 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8426852-B2 Transistors and electronic apparatuses including same SAMSUNG ELECTRONICS CO., LTD. (KR) 2013-04-23 — — US claimed
US-20110133176-A1 Transistor and electronic apparatus including same SAMSUNG ELECTRONICS CO., LTD. (KR) 2011-06-09 — — US claimed
US-7842734-B2 Poly(arylene ether) copolymers containing pyridine units as proton exchange membranes ADVENT TECHNOLOGIES SA (GR) 2010-11-30 — — US claimed
US-7800102-B2 Organic thin film transistor including a self-assembly monolayer between an insulating layer and an organic semiconductor layer and flat panel display comprising the same SAMSUNG MOBILE DISPLAY CO., LTD. (KR) 2010-09-21 — — US claimed
WO-2008117113-A2 POLY (ARYLENE ETHER) COPOLYMER CONTAINING PYRIDINE UNITS AND ITS USE AS PROTON EXCHANGE MEMBRANES ADVENT TECHNOLOGIES (GR) 2008-10-02 — — WO claimed
US-20080160378-A1 Novel poly(arylene ether) copolymers containing pyridine units as proton exchange membranes ADVENT TECHNOLOGIES SA (GR) 2008-07-03 — — US claimed
EP-1777757-A2 Organic thin film transistor comprising a self assembled monolayer Samsung SDI Co., Ltd. (KR) 2007-04-25 — — EP claimed
US-20070087489-A1 Organic thin film transistor, method of manufacturing the same, and flat panel display comprising the same SAMSUNG SDI CO., LTD. (KR) 2007-04-19 — — US claimed
EP-1390972-B1 METHOD OF FABICATING LOW-DIELECTRIC CONSTANT INTERLEVEL DIELECTRIC FILMS FOR BEOL INTERCONNECTS WITH ENHANCED ADHESION AND LOW-DEFECT DENSITY IBM (US) 2006-07-12 — — EP claimed
US-6726996-B2 USEFUL AS A DIELECTRIC CAPPING LAYER FOR INTERCONNECT STRUCTURES THAT INCLUDE WIRING REGIONS THAT ARE SURROUNDED BY ORGANIC INTERLEVEL DIELECTRICS, OR POROUS DIELECTRICS (INCLUDING ORGANIC AND INORGANIC) INTERNATIONAL BUSINESS MACHINES CORPORATION 2004-04-27 — — US claimed
EP-1390972-A2 METHOD OF FABICATING LOW-DIELECTRIC CONSTANT INTERLEVEL DIELECTRIC FILMS FOR BEOL INTERCONNECTS WITH ENHANCED ADHESION AND LOW-DEFECT DENSITY International Business Machines Corporation (US) 2004-02-25 — — EP claimed
US-20020172811-A1 Useful as a dielectric capping layer for interconnect structures that include wiring regions that are surrounded by organic interlevel dielectrics, or porous dielectrics (including organic and inorganic) INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2002-11-21 — — US claimed
US-20020160600-A1 Method of fabricating low-dielectric constant interlevel dielectric films for BEOL interconnects with enhanced adhesion and low-defect density INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2002-10-31 — — US claimed
US-6455443-B1 APPLYING UNIFORM COATING OF SILANE COUPLING AGENT CONTAINING POLYMERIZABLE GROUP TO SURFACE OF SUBSTRATE, HEATING TO PROVIDE MODIFIED SURFACE LAYER CONTAINING SI-O BONDS, RINSING WITH SOLVENT TO REMOVE UNREACTED COUPLER, APPLYING DIELECTRIC INTERNATIONAL BUSINESS MACHINES CORPORATION 2002-09-24 — — US claimed
WO-2002069381-A2 METHOD OF FABRICATING LOW-DIELECTRIC CONSTANT INTERLEVEL DIELECTRIC FILMS FOR BEOL INTERCONNECTS WITH ENHANCED ADHESION AND LOW-DEFECT DENSITY INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2002-09-06 — — WO claimed
US-6120970-A Polybenzoxazole and polybenzothiazole precursors SIEMENS AKTIENGESELLSCHAFT (DE) 2000-09-19 — — US claimed
JP-1236205-A — — None — — JP disclosed
JP-1168630-A — — None — — JP disclosed
JP-H01236205-A THERMOSETTING RESIN COMPOSITION AND CURED PRODUCT THEREOF HITACHI LTD 1989-09-21 — — JP disclosed
JP-H01168630-A NOVEL FLUORINE-CONTAINING AROMATIC UNSATURATED COMPOUND AND PRODUCTION THEREOF CENTRAL GLASS CO LTD 1989-07-04 — — JP disclosed
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