SCHEMBL3266985

SCHEMBL3266985

FC(F)OC(F)C(F)C(F)F

nearest known ligand 0.30

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
MEN1 O00255 1/20 0.30
KMT2A Q03164 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1361551 0.85
SCHEMBL28399122 0.79
SCHEMBL29041110 0.79
SCHEMBL3271960 0.69 MEN1 (0.31) MEN1KMT2A
SCHEMBL106687 0.66
SCHEMBL29034479 0.66
SCHEMBL25363602 0.64
SCHEMBL29222409 0.64
SCHEMBL29257756 0.62
SCHEMBL32349 0.61

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 11 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
JP-8245468-A None JP disclosed
US-20250343048-A1 ETCHING METHOD RESONAC CORPORATION (JP) 2025-11-06 US disclosed
EP-4481794-A1 ETCHING METHOD Resonac Corporation (JP) 2024-12-25 EP disclosed
CN-118679554-A Etching method 株式会社力森诺科 2024-09-20 CN disclosed
US-9822015-B2 Method for producing lithium composite metal oxide, lithium composite metal oxide, and nonaqueous electrolyte secondary battery SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-11-21 US disclosed
US-20120244413-A1 METHOD FOR PRODUCING LITHIUM COMPOSITE METAL OXIDE, LITHIUM COMPOSITE METAL OXIDE, AND NONAQUEOUS ELECTROLYTE SECONDARY BATTERY SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-09-27 US disclosed
EP-1900801-B1 Substrate water-removing agent, and water-removing method and drying method employing same FUJIFILM CORP (JP) 2010-06-16 EP disclosed
US-20080066337-A1 SUBSTRATE WATER-REMOVING AGENT, AND WATER-REMOVING METHOD AND DRYING METHOD EMPLOYING SAME FUJIFILM CORPORATION (JP) 2008-03-20 US disclosed
EP-1900801-A1 Substrate water-removing agent, and water-removing method and drying method employing same FUJIFILM Corporation (JP) 2008-03-19 EP disclosed
US-5779931-A COMPRISING AT LEAST ONE FLUOROETHER AND AT LEAST ONE HYDROFLUOROCARBON; REFRIGERANTS, CLEANING AGENTS E. I. DU PONT DE NEMOURS AND COMPANY (US) 1998-07-14 US disclosed
JP-H08245468-A AZEOTROPIC COMPOSITION COMPRISING FLUORINE-CONTAINING ETHER AND METHANOL AGENCY OF IND SCIENCE & TECHNOL 1996-09-24 JP disclosed