SCHEMBL329407

SCHEMBL329407

CO[Si](C[Si](OC)(OC)OC)(OC)OC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15495612 0.89
SCHEMBL5416594 0.84
SCHEMBL9404270 0.81
SCHEMBL5415403 0.81
SCHEMBL331462 0.81
SCHEMBL5410397 0.81
SCHEMBL13686038 0.80
SCHEMBL3420286 0.80
SCHEMBL28062778 0.80
SCHEMBL12109453 0.78

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 1193 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250391655-A1 METHOD OF FILLING GAP AND PROCESSING SYSTEM FOR SAME ASM IP HOLDING BV (NL) 2025-12-25 US claimed
WO-2024222666-A1 POROUS MOLECULAR SIEVE MATERIAL, PREPARATION METHOD, AND APPLICATION THEREOF 中国石油化工股份有限公司 2024-10-31 WO claimed
US-20240361695-A1 STRUCTURES INCLUDING A SiOCN PHOTORESIST ADHESION LAYER AND METAL-OXIDE RESIST AND METHODS OF FORMING SAME ASM IP HOLDING B.V. (NL) 2024-10-31 US claimed
CN-118859631-A Structure including photoresist adhesive layer and method of forming the same ASM IP私人控股有限公司 2024-10-29 CN claimed
CN-118833831-A Porous molecular sieve material, preparation method and application thereof 中国石油化工股份有限公司 2024-10-25 CN claimed
CN-118598151-A Molecular sieve material, preparation method and application thereof 中国石油化工股份有限公司 2024-09-06 CN claimed
CN-107636097-B Silicone polymer composition and use thereof 奥普提汀公司 2024-03-15 CN claimed
US-11820929-B2 Etching compositions FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2023-11-21 US claimed
US-20230288810-A1 METHOD OF FORMING A STRUCTURE COMPRISING A PHOTORESIST UNDERLAYER ASM IP HOLDING B.V. (NL) 2023-09-14 US claimed
CN-116736637-A Method of forming a structure comprising a photoresist underlayer ASM IP私人控股有限公司 2023-09-12 CN claimed
US-20080246153-A1 ORGANIC SILICA-BASED FILM, METHOD OF FORMING THE SAME, COMPOSITION FOR FORMING INSULATING FILM FOR SEMICONDUCTOR DEVICE, INTERCONNECT STRUCTURE, AND SEMICONDUCTOR DEVICE JSR CORPORATION (JP) 2008-10-09 US claimed
EP-1970421-A1 COATING LIQUID FOR FORMING LOW DIELECTRIC CONSTANT AMORPHOUS SILICA COATING FILM AND LOW DIELECTRIC CONSTANT AMORPHOUS SILICA COATING FILM OBTAINED FROM SUCH COATING LIQUID CATALYSTS & CHEMICALS INDUSTRIES CO., LTD. (JP) 2008-09-17 EP claimed
US-7399715-B2 Organic silica-based film, method of forming the same, composition for forming insulating film for semiconductor device, interconnect structure, and semiconductor device JSR CORPORATION (JP) 2008-07-15 US claimed
WO-2007123309-A1 MESOPOROUS INORGANIC COMPOSITE POWDER CONTAINING METAL ELEMENT IN ITS STRUCTURE AND THE METHOD FOR MANUFACTURING THEREOF AMOREPACIFIC CORPORATION (KR) 2007-11-01 WO claimed
US-20040146766-A1 Proton electrolyte membranes, methods of making proton electrolyte membranes, and methods of use thereof GEORGIA TECH RESEARCH CORPORATION 2004-07-29 US claimed
EP-0922386-B1 Controlled release compositions ROHM & HAAS (US) 2004-02-04 EP claimed
US-20030232137-A1 Porogens, porogenated precursors and methods for using the same to provide porous organosilica glass films with low dielectric constants VERSUM MATERIALS US, LLC 2003-12-18 US claimed
EP-1354980-A1 Method for forming a porous SiOCH layer. AIR PRODUCTS AND CHEMICALS, INC. (US) 2003-10-22 EP claimed
US-6090399-A POROUS MATRIX ROHM AND HAAS COMPANY (US) 2000-07-18 US claimed
EP-0922386-A2 Controlled release compositions ROHM AND HAAS COMPANY (US) 1999-06-16 EP claimed