SCHEMBL3310798

SCHEMBL3310798

[Cd+2].[Cd+2].[Cr+3].[Cr+3].[O-2].[O-2].[O-2].[O-2].[O-2]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30186438 0.82
SCHEMBL29499926 0.82
SCHEMBL15355 0.82
SCHEMBL2474199 0.82
SCHEMBL18965 0.82
SCHEMBL31718133 0.82
SCHEMBL8441047 0.82
SCHEMBL11098030 0.82
SCHEMBL21144337 0.82
SCHEMBL29672001 0.82

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 31 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11891327-B2 Fabrication of low defectivity electrochromic devices VIEW, INC. (US) 2024-02-06 US claimed
US-11440838-B2 Fabrication of low defectivity electrochromic devices VIEW, INC. (US) 2022-09-13 US claimed
CN-113359362-A Fabrication of low defect rate electrochromic devices 唯景公司 2021-09-07 CN claimed
US-11891327-B2 Fabrication of low defectivity electrochromic devices VIEW, INC. (US) 2024-02-06 US disclosed
US-20230205032-A1 COUNTER ELECTRODE MATERIAL FOR ELECTROCHROMIC DEVICES VIEW OPERATING CORPORATION 2023-06-29 US disclosed
EP-3137942-B1 FABRICATION OF LOW DEFECTIVITY ELECTROCHROMIC DEVICES VIEW INC (US) 2023-06-28 EP disclosed
US-11635665-B2 Counter electrode material for electrochromic devices VIEW, INC. (US) 2023-04-25 US disclosed
US-20220388900-A1 FABRICATION OF LOW DEFECTIVITY ELECTROCHROMIC DEVICES VIEW OPERATING CORPORATION 2022-12-08 US disclosed
US-11440838-B2 Fabrication of low defectivity electrochromic devices VIEW, INC. (US) 2022-09-13 US disclosed
CN-113359362-A Fabrication of low defect rate electrochromic devices 唯景公司 2021-09-07 CN disclosed
CN-106462021-B Fabrication of low defect rate electrochromic devices 唯景公司 2021-06-25 CN disclosed
EP-3137942-A1 FABRICATION OF LOW DEFECTIVITY ELECTROCHROMIC DEVICES View, Inc. (US) 2017-03-08 EP disclosed
CN-106462021-A Fabrication of Low Defect Rate Electrochromic Devices 唯景公司 2017-02-22 CN disclosed
US-20160272883-A1 COATED SEMICONDUCTOR NANOPARTICLE AND METHOD FOR MANUFACTURING THE SAME Konica Minolta, Inc. (JP) 2016-09-22 US disclosed
EP-3070143-A1 COATED SEMICONDUCTOR NANOPARTICLE AND METHOD FOR MANUFACTURING THE SAME Konica Minolta, Inc. (JP) 2016-09-21 EP disclosed
US-20160149091-A1 LIGHT-EMITTING MATERIAL, METHOD FOR PRODUCING SAME, OPTICAL FILM, AND LIGHT-EMITTING DEVICE Konica Minolta, Inc. (JP) 2016-05-26 US disclosed
US-20150076469-A1 ORGANIC ELECTROLUMINESCENT ELEMENT Konica Minolta, Inc. (JP) 2015-03-19 US disclosed
US-20100110269-A1 IMAGE PICK-UP DEVICE AND METHOD FOR MANUFACTURING THE DEVICE KONICA MINOLTA OPTO, INC. (JP) 2010-05-06 US disclosed
EP-2131214-A1 IMAGE PICK-UP DEVICE AND METHOD FOR MANUFACTURING THE DEVICE Konica Minolta Opto, Inc. (JP) 2009-12-09 EP disclosed
US-20070265381-A1 Thermoplastic Resin Composition and Optical Element Utilizing the Same KONICA MINOLTA OPTO, INC. (JP) 2007-11-15 US disclosed