SCHEMBL332944

SCHEMBL332944

CO[Si](C)(C)C[Si](C)(C)OC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL996897 0.85
SCHEMBL13169071 0.84
SCHEMBL9404241 0.82
SCHEMBL12898567 0.82
SCHEMBL309171 0.82
SCHEMBL10014104 0.77
SCHEMBL20090042 0.77
SCHEMBL13089133 0.77
SCHEMBL331046 0.75
SCHEMBL309836 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 195 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-122056125-A RF pulsed assisted low-K film deposition with high mechanical strength 应用材料公司 2026-05-15 CN claimed
EP-4632019-A1 COATING COMPOSITION FOR ARTIFICIAL LEATHER, METHODS AND USES THEREOF TMG - Tecidos Plastificados e Outros Revestimentos para a Indústria Automóvel, S.A. (PT) 2025-10-15 EP claimed
WO-2025049147-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-03-06 WO claimed
US-20250069884-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-02-27 US claimed
WO-2025034650-A1 RF PULSING ASSISTED LOW-K DEPOSITION WITH HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-02-13 WO claimed
US-20250054749-A1 RF PULSING ASSISTED LOW-K FILM DEPOSITION WITH HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-02-13 US claimed
US-7500397-B2 Activated chemical process for enhancing material properties of dielectric films AIR PRODUCTS AND CHEMICALS, INC. (US) 2009-03-10 US claimed
US-20080199977-A1 Activated Chemical Process for Enhancing Material Properties of Dielectric Films AIR PRODUCTS AND CHEMICALS, INC. (US) 2008-08-21 US claimed
EP-1959485-A2 Activated chemical process for enhancing material properties of dielectric films Air Products and Chemicals, Inc. (US) 2008-08-20 EP claimed
US-20070181873-A1 Organic-inorganic hybrid polymer and organic insulator composition having the same and methods thereof SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-08-09 US claimed
CN-122056125-A RF pulsed assisted low-K film deposition with high mechanical strength 应用材料公司 2026-05-15 CN disclosed
EP-4632019-A1 COATING COMPOSITION FOR ARTIFICIAL LEATHER, METHODS AND USES THEREOF TMG - Tecidos Plastificados e Outros Revestimentos para a Indústria Automóvel, S.A. (PT) 2025-10-15 EP disclosed
WO-2025049147-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-03-06 WO disclosed
US-20250069884-A1 METHODS FOR FORMING LOW-K DIELECTRIC MATERIALS WITH REDUCED DIELECTRIC CONSTANT AND HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-02-27 US disclosed
WO-2025034650-A1 RF PULSING ASSISTED LOW-K DEPOSITION WITH HIGH MECHANICAL STRENGTH APPLIED MATERIALS, INC. (US) 2025-02-13 WO disclosed
EP-1122770-A2 Silica-based insulating film and its manufacture JSR Corporation (JP) 2001-08-08 EP disclosed
US-20010009936-A1 Method of manufacturing material for forming insulating film JSR CORPORATION (JP) 2001-07-26 US disclosed
EP-1117102-A2 Method of manufacturing material for forming insulating film JSR Corporation (JP) 2001-07-18 EP disclosed
EP-1058274-A1 Composition for film formation and material for insulating film formation JSR Corporation (JP) 2000-12-06 EP disclosed
EP-1045290-A2 Composition for resist underlayer film and method for producing the same JSR Corporation (JP) 2000-10-18 EP disclosed