SCHEMBL3481931

SCHEMBL3481931

C=CC(C=C)CCO[SiH3]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1585581 0.71
SCHEMBL22654219 0.69
SCHEMBL16752005 0.65
SCHEMBL21313676 0.65
SCHEMBL6561386 0.64 SLC6A2 (0.33)
SCHEMBL15301594 0.64
SCHEMBL22654145 0.62
SCHEMBL1230084 0.62
SCHEMBL3641102 0.61
SCHEMBL3858477 0.61

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1212380-A1 CHEMICALLY MODIFIED SILICA FILLERS, PROCESS FOR PRODUCING, AND SILICONE COMPOSITIONS CONTAINING SAME DOW CORNING CORPORATION (US) 2002-06-12 EP claimed
US-6384125-B1 CONTACTING ACIDIC AQUEOUS SUSPENSION OF PRECIPITATED OR COLLOIDAL SILICA WITH COMBINATION OF FUNCTIONALIZING COUPLING AGENT AND ORGANOMETALLIC HYDROPHOBING COMPOUND, NEUTRALIZING TO INCREASE PH, RECOVERING MODIFIED FILLER DOW CORNING CORPORATION 2002-05-07 US claimed
WO-2001014480-A1 CHEMICALLY MODIFIED SILICA FILLERS, PROCESS FOR PRODUCING, AND SILICONE COMPOSITIONS CONTAINING SAME DOW CORNING CORPORATION (US) 2001-03-01 WO claimed
EP-2128897-B1 SILICON DIELECTRIC TREATING AGENT FOR USE AFTER ETCHING, PROCESS FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJITSU LTD (JP) 2015-05-06 EP disclosed
US-8716209-B2 Agent for post-etch treatment of silicon dielectric film, method of manufacturing semiconductor device, and semiconductor device FUJITSU LIMITED (JP) 2014-05-06 US disclosed
US-20100007031-A1 AGENT FOR POST-ETCH TREATMENT OF SILICON DIELECTRIC FILM, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJITSU LIMITED (JP) 2010-01-14 US disclosed
EP-2128897-A1 SILICON DIELECTRIC TREATING AGENT FOR USE AFTER ETCHING, PROCESS FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE Fujitsu Limited (JP) 2009-12-02 EP disclosed
EP-1212380-A1 CHEMICALLY MODIFIED SILICA FILLERS, PROCESS FOR PRODUCING, AND SILICONE COMPOSITIONS CONTAINING SAME DOW CORNING CORPORATION (US) 2002-06-12 EP disclosed
US-6384125-B1 CONTACTING ACIDIC AQUEOUS SUSPENSION OF PRECIPITATED OR COLLOIDAL SILICA WITH COMBINATION OF FUNCTIONALIZING COUPLING AGENT AND ORGANOMETALLIC HYDROPHOBING COMPOUND, NEUTRALIZING TO INCREASE PH, RECOVERING MODIFIED FILLER DOW CORNING CORPORATION 2002-05-07 US disclosed
WO-2001014480-A1 CHEMICALLY MODIFIED SILICA FILLERS, PROCESS FOR PRODUCING, AND SILICONE COMPOSITIONS CONTAINING SAME DOW CORNING CORPORATION (US) 2001-03-01 WO disclosed