SCHEMBL3608653

SCHEMBL3608653

COc1c2occc2c(S(=O)(=O)C(F)(F)F)c2c(=O)cc(OCCCc3ccccc3)oc12

nearest known ligand 0.47

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KCNA3 P22001 7/20 0.47
MAPT P10636 1/20 0.45
CYP1A2 P05177 3/20 0.41
CYP3A4 P08684 3/20 0.41
ALDH1A1 P00352 2/20 0.41
CYP2D6 P10635 2/20 0.41
MAPK1 P28482 2/20 0.41
CYP2C19 P33261 2/20 0.41
CYP1A1 P04798 2/20 0.41
HPGD P15428 2/20 0.41
CYP1B1 Q16678 2/20 0.41
PDE4A P27815 1/20 0.41
SMN1; SMN2 Q16637 1/20 0.41
MAOA P21397 1/20 0.37
MAOB P27338 1/20 0.37
KDM4E B2RXH2 2/20 0.37
LMNA P02545 1/20 0.37
CYP2C9 P11712 1/20 0.37
TSHR P16473 1/20 0.37
NFKB1 P19838 1/20 0.37

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3612950 0.86 KCNA3 (0.53) KCNA3MAPTCYP1A2CYP3A4ALDH1A1
SCHEMBL3615484 0.78 CYP3A4 (0.67) KCNA3MAPTCYP1A2CYP3A4ALDH1A1
SCHEMBL4391206 0.70 KCNA3 (0.55) KCNA3MAPTCYP1A2CYP3A4ALDH1A1
SCHEMBL3607100 0.69 KCNA3 (0.61) KCNA3CYP1A2CYP3A4ALDH1A1CYP2D6
SCHEMBL4386477 0.68 KCNA3 (0.46) KCNA3CYP1A2CYP3A4ALDH1A1CYP2D6
SCHEMBL4386530 0.68 KCNA3 (0.59) KCNA3CYP1A2CYP3A4ALDH1A1CYP2D6
SCHEMBL7279457 0.66 KCNA3 (0.74) KCNA3MAPTCYP1A2CYP3A4ALDH1A1
SCHEMBL4390506 0.65 KCNA3 (0.46) KCNA3CYP1A2CYP3A4ALDH1A1CYP2D6
SCHEMBL4380645 0.65 KCNA3 (0.46) KCNA3CYP1A2CYP3A4ALDH1A1CYP2D6
SCHEMBL10300861 0.64 CYP3A4 (0.72) KCNA3MAPTCYP1A2CYP3A4ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 37 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240063063-A1 COMPACT CMOS FABRICATION WELCH JAMES D (US) 2024-02-22 US disclosed
US-11798946-B2 Compact FINFET CMOS WELCH JAMES D (US) 2023-10-24 US disclosed
EP-4174907-A1 METHOD AND APPARATUS FOR MASS ANALYSING A SAMPLE Tofwerk AG (CH) 2023-05-03 EP disclosed
US-20230117871-A1 COMPACT CMOS WELCH JAMES D (US) 2023-04-20 US disclosed
US-20230080743-A1 Compact CMOS in wide bandgap semiconductor WELCH JAMES D (US) 2023-03-16 US disclosed
US-20210247688-A1 SUBSTRATE WITH MULTILAYER REFLECTIVE FILM, REFLECTIVE MASK BLANK, REFLECTIVE MASK, AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE HOYA CORPORATION (JP) 2021-08-12 US disclosed
US-20210020637-A1 COMPACT FINFET CMOS WELCH JAMES D (US) 2021-01-21 US disclosed
US-9349407-B2 Data storage medium surface smoothing method and associated apparatus HGST Netherlands B.V. (NL) 2016-05-24 US disclosed
US-20130221320-A1 LED WITH EMBEDDED DOPED CURRENT BLOCKING LAYER TSMC SOLID STATE LIGHTING LTD. (TW) 2013-08-29 US disclosed
US-20130146562-A1 DATA STORAGE MEDIUM SURFACE SMOOTHING METHOD AND ASSOCIATED APPARATUS WESTERN DIGITAL TECHNOLOGIES, INC. 2013-06-13 US disclosed
WO-2005013440-A2 ELECTRODES FOR FLUORINE GAS DISCHARGE LASERS CYMER, INC. (A NEVADA CORPORATION) (US) 2005-02-10 WO disclosed
US-20040165638-A1 Electrodes for fluorine gas discharge lasers CYMER, LLC 2004-08-26 US disclosed
US-20040071178-A1 Anodes for fluorine gas discharge lasers CYMER, LLC 2004-04-15 US disclosed
US-20040066827-A1 Cathodes for fluorine gas discharge lasers CYMER, LLC 2004-04-08 US disclosed
US-5834787-A Device for measuring flux and accumulated dose for an ion beam containing a radioactive element IMPLANT SCIENCES CORPORATION 1998-11-10 US disclosed
EP-0389198-B1 Method of manufacturing an X-ray exposure mask and device for controlling the internal stress of thin films TOSHIBA KK (JP) 1997-10-15 EP disclosed
US-5457324-A Spectrum analyzer in an ion implanter APPLIED MATERIALS, INC. (US) 1995-10-10 US disclosed
US-5384465-A Spectrum analyzer in an ion implanter APPLIED MATERIALS, INC. (US) 1995-01-24 US disclosed
US-5188706-A METHOD OF MANUFACTURING AN X-RAY EXPOSURE MASK AND DEVICE FOR CONTROLLING THE INTERNAL STRESS OF THIN FILMS KABUSHIKI KAISHA TOSHIBA (JP) 1993-02-23 US disclosed
EP-0389198-A2 Method of manufacturing an X-ray exposure mask and device for controlling the internal stress of thin films KABUSHIKI KAISHA TOSHIBA (JP) 1990-09-26 EP disclosed