SCHEMBL384221

SCHEMBL384221

C=CC(=O)OCC1(C)COC1

nearest known ligand 0.41

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
TSHR P16473 7/20 0.41
ALDH1A1 P00352 4/20 0.40
TP53 P04637 3/20 0.40
HIF1A Q16665 3/20 0.40
CYP3A4 P08684 2/20 0.40
MAPK1 P28482 1/20 0.40
SMN1; SMN2 Q16637 1/20 0.40
HPGD P15428 1/20 0.40
HSD17B10 Q99714 1/20 0.39
EPHX1 P07099 1/20 0.39
THRB P10828 2/20 0.34
ACACB O00763 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13623220 0.93 TSHR (0.39) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL13949190 0.93 TSHR (0.39) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL17850002 0.86 TSHR (0.39) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL16093949 0.85 EPHX1 (0.41) ALDH1A1SMN1; SMN2EPHX1THRBACACB
SCHEMBL13968333 0.83 TSHR (0.37) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL2132862 0.82 TSHR (0.46) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL28031618 0.80 GSTP1 (0.39) EPHX1
SCHEMBL5370621 0.80 EPHX1 (0.38) TSHRALDH1A1SMN1; SMN2EPHX1ACACB
SCHEMBL27778682 0.79 TSHR (0.42) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL1316484 0.79 TSHR (0.47) TSHRALDH1A1TP53HIF1ACYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 919 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-120044753-A Photosensitive dry film, photosensitive resin composition, cured film and printed circuit board 杭州福斯特电子材料有限公司 2025-05-27 CN claimed
WO-2025020810-A1 ETCHING RESIDUE REMOVER COMPOSITION 安集微电子科技(上海)股份有限公司 2025-01-30 WO claimed
US-20240368505-A1 FLUORINE-FREE CLEANING AGENT, PREPARATION METHOD THEREFOR AND USE THEREOF Tan Kah Kee Innovation Laboratory (CN) 2024-11-07 US claimed
WO-2024125373-A1 ETCHING COMPOSITION AND USE THEREOF 宁波安集微电子科技有限公司 2024-06-20 WO claimed
CN-118185630-A Etching composition and application thereof 宁波安集微电子科技有限公司 2024-06-14 CN claimed
US-20240047224-A1 RECESS ETCHING SOLUTION, RECESS ETCHING METHOD, AND SURFACE-TREATED SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2024-02-08 US claimed
EP-4257727-A1 RECESS ETCHING SOLUTION, RECESS ETCHING METHOD, AND SURFACE-TREATED SEMICONDUCTOR SUBSTRATE MANUFACTURING METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2023-10-11 EP claimed
US-20230295503-A1 ETCHANT COMPOSITION AND MANUFACTURING METHOD OF DISPLAY DEVICE USING THE SAME SAMSUNG DISPLAY CO., LTD. (KR) 2023-09-21 US claimed
CN-116770304-A Etchant composition and method for manufacturing display device using the same 三星显示有限公司 2023-09-19 CN claimed
CN-116731798-A Fluorine-free cleaning agent, and preparation method and application thereof 嘉庚创新实验室 2023-09-12 CN claimed
US-20180194949-A1 SOL-GEL COATING COMPOSITIONS INCLUDING CORROSION INHIBITOR-ENCAPSULATED LAYERED METAL PHOSPHATES AND RELATED PROCESSES THE BOEING COMPANY 2018-07-12 US claimed
EP-3345975-A1 SOL-GEL COATING COMPOSITIONS INCLUDING CORROSION INHIBITOR-ENCAPSULATED LAYERED METAL PHOSPHATES AND RELATED PROCESSES The Boeing Company (US) 2018-07-11 EP claimed
US-20180022937-A1 SOL-GEL COATING COMPOSITIONS INCLUDING CORROSION INHIBITOR-ENCAPSULATED LAYERED DOUBLE HYDROXIDE AND RELATED PROCESSES THE BOEING COMPANY 2018-01-25 US claimed
EP-3272816-A1 SOL-GEL COATING COMPOSITIONS INCLUDING CORROSION INHIBITOR-ENCAPSULATED LAYERED DOUBLE HYDROXIDE AND RELATED PROCESSES The Boeing Company (US) 2018-01-24 EP claimed
EP-2014797-A2 Coating composition for interconnection part of electrode and plasma display panel including the same Samsung SDI Co., Ltd. (KR) 2009-01-14 EP claimed
US-20080303439-A1 Coating composition for interconnection part of electrode and plasma display panel including the same SAMSUNG SDI CO., LTD., A CORP. OF THE REPUBLIC OF KOREA (KR) 2008-12-11 US claimed
US-6447695-B1 WITH POLISHING RATE ADJUSTOR JSR CORPORATION (JP) 2002-09-10 US claimed
US-20020005017-A1 Polishing cycles JSR CORPORATION (JP) 2002-01-17 US claimed
EP-1138734-A2 Aqueous dispersion for chemical mechanical polishing of metal films JSR Corporation (JP) 2001-10-04 EP claimed
US-6261741-B1 CONTAINS POLYAMIDEIMIDE RESIN, AN ORGANIC SOLVENT, ACRYLIC MONOMER OR OLIGOMER, AND PHOTOINITIATOR; MAY BE PATTERNED BY SELECTIVE ULTRAVIOLET RADIATION; USED AS PHOTO-CURING ADHESIVE OR LAYER IN HIGH-DENSITY PRINTED CIRCUIT BOARD FUJITSU LIMITED (JP) 2001-07-17 US claimed