SCHEMBL3972530

SCHEMBL3972530

O=C(O)C12C(F)(F)C3(F)C(F)(F)C(F)(C(F)(F)C(F)(C3(F)F)C1(F)F)C2(F)F

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Fluoride SCHEMBL4810308 0.97
SCHEMBL820859 0.75
SCHEMBL31163706 0.73
SCHEMBL31163705 0.73
SCHEMBL31163709 0.73
SCHEMBL14543921 0.73
SCHEMBL4469566 0.73
SCHEMBL3843958 0.71
SCHEMBL14544071 0.69
SCHEMBL708310 0.66 MEN1 (0.50)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1730593-B1 A PROCESS OF IMAGING A DEEP ULTRAVIOLET PHOTORESIST WITH A TOP COATING MERCK PATENT GMBH (DE) 2019-04-24 EP disclosed
US-7473512-B2 Process of imaging a deep ultraviolet photoresist with a top coating and materials thereof AZ ELECTRONIC MATERIALS USA CORP. (US) 2009-01-06 US disclosed
US-7425646-B2 Fluorinated adamantane derivative ASAHI GLASS COMPANY, LIMITED (JP) 2008-09-16 US disclosed
US-20070083064-A1 NOVEL FLUORINATED ADAMANTANE DERIVATIVE ASAHI GLASS COMPANY, LIMITED (JP) 2007-04-12 US disclosed
EP-1730593-A2 A PROCESS OF IMAGING A DEEP ULTRAVIOLET PHOTORESIST WITH A TOP COATING AND MATERIALS THEREOF AZ Electronic Materials USA Corp. (US) 2006-12-13 EP disclosed
WO-2005088397-A2 A PROCESS OF IMAGING A DEEP ULTRAVIOLET PHOTORESIST WITH A TOP COATING AND MATERIALS THEREOF AZ ELECTRONIC MATERIALS USA CORP. (DE) 2005-09-22 WO disclosed
US-20050202340-A1 Process of imaging a deep ultraviolet photoresist with a top coating and materials thereof MERCK PATENT GMBH (DE) 2005-09-15 US disclosed
US-20050202347-A1 Process of imaging a deep ultraviolet photoresist with a top coating and materials thereof AZ ELECTRONIC MATERIALS USA CORP. 2005-09-15 US disclosed