SCHEMBL4260581

SCHEMBL4260581

CC1COC(=O)C1C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7908838 1.00
SCHEMBL20097735 1.00
SCHEMBL7906063 1.00
SCHEMBL19118462 1.00
SCHEMBL13533913 0.84
SCHEMBL873222 0.84
SCHEMBL13537778 0.80
SCHEMBL7679321 0.76
SCHEMBL5954153 0.76
SCHEMBL24996793 0.74

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 195 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11835857-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-12-05 US disclosed
US-11835857-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-12-05 US disclosed
US-11829068-B2 Resist composition, method of forming resist pattern, compound, and resin TOKYO OHKA KOGYO CO., LTD. (JP) 2023-11-28 US disclosed
US-11780946-B2 Alternating copolymer, method of producing alternating copolymer, method of producing polymeric compound, and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-10-10 US disclosed
US-11762288-B2 Resist composition, method of forming resist pattern, and acid diffusion-controlling agent TOKYO OHKA KOGYO CO., LTD. (JP) 2023-09-19 US disclosed
US-11754922-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-09-12 US disclosed
US-11754922-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-09-12 US disclosed
US-11747726-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-09-05 US disclosed
US-11709425-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-07-25 US disclosed
US-11709425-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-07-25 US disclosed
EP-1874845-A2 METHOD FOR PRODUCING POLYHYDROXYALKANOATES BASF AKTIENGESELLSCHAFT (DE) 2008-01-09 EP disclosed
US-7241552-B2 Resist composition comprising photosensitive polymer having lactone in its backbone SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-07-10 US disclosed
US-7145022-B2 Catalyst for the carbonylation of oxiranes BASF AKTIENGESELLSCHAFT (DE) 2006-12-05 US disclosed
WO-2006108829-A2 METHOD FOR PRODUCING POLYHYDROXYALKANOATES BASF AKTIENGESELLSCHAFT (DE) 2006-10-19 WO disclosed
WO-2006058681-A2 METHOD FOR PRODUCING ENANTIOMER-ENRICHED LACTONES BASF AKTIENGESELLSCHAFT (DE) 2006-06-08 WO disclosed
US-20050240032-A1 Catalyst for the carbonylation of oxiranes BASF AKTIENGESELLSCHAFT (DE) 2005-10-27 US disclosed
EP-0602515-B1 Process for the preparation of 5-membered heterocycles BASF AG (DE) 1998-07-15 EP disclosed
US-5453516-A Furanones, pyrrolidones BASF AKTIENGESELLSCHAFT (DE) 1995-09-26 US disclosed
US-5401857-A Process for making γ-butyrolactones ARCO CHEMICAL TECHNOLOGY, L.P. (US) 1995-03-28 US disclosed
EP-0602515-A1 Process for the preparation of 5-membered heterocycles BASF Aktiengesellschaft (DE) 1994-06-22 EP disclosed