SCHEMBL435136

SCHEMBL435136

[HH].[HH].[HH].[HH].[HH].[HH].[SiH3][SiH3]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL48935 0.82
SCHEMBL27801878 0.82
Methane SCHEMBL3703632 0.67
SCHEMBL4542496 0.67
SCHEMBL276330 0.67
Phosphine SCHEMBL23752071 0.67
Hydrochloric Acid SCHEMBL3301669 0.67 CA4 (0.33)
SCHEMBL1257065 0.67
SCHEMBL10710901 0.67
Fluoride SCHEMBL9347415 0.67

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 44 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2596148-B1 METHOD FOR MANUFACTURING A BARRIER COATING. FUJIFILM MFG EUROPE BV (NL) 2018-09-26 EP disclosed
EP-2596147-B1 METHOD FOR MANUFACTURING A BARRIER LAYER FUJIFILM MFG EUROPE BV (NL) 2017-09-06 EP disclosed
US-8815750-B2 Method for manufacturing a barrier on a sheet and a sheet for PV modules FUJIFILM MANUFACTURING EUROPE B.V. (NL) 2014-08-26 US disclosed
US-8815749-B2 Method for manufacturing a barrier layer on a substrate and a multi-layer stack FUJIFILM MANUFACTURING EUROPE B.V. (NL) 2014-08-26 US disclosed
US-20130178060-A1 Method for Manufacturing a Barrier Layer on a Substrate and a Multi-Layer Stack FUJIFILM MANUFACTURING EUROPE B.V. (NL) 2013-07-11 US disclosed
EP-2596147-A1 METHOD FOR MANUFACTURING A BARRIER LAYER Fujifilm Manufacturing Europe BV (NL) 2013-05-29 EP disclosed
EP-2596148-A1 METHOD FOR MANUFACTURING A BARRIER COATING Fujifilm Manufacturing Europe BV (NL) 2013-05-29 EP disclosed
US-8445897-B2 Method for manufacturing a multi-layer stack structure with improved WVTR barrier property FUJIFILM MANUFACTURING EUROPE B.V. (NL) 2013-05-21 US disclosed
US-20130122719-A1 Method for Manufacturing a Barrier on a Sheet and a Sheet for PV Modules FUJIFILM MANUFACTURING EUROPE B.V. (NL) 2013-05-16 US disclosed
US-8323753-B2 Method for deposition using pulsed atmospheric pressure glow discharge FUJIFILM MANUFACTURING EUROPE B.V. (NL) 2012-12-04 US disclosed
EP-1371752-B1 Layer formation method, and substrate with a layer formed by the method KONICA CORP (JP) 2008-05-07 EP disclosed
WO-2007139379-A1 METHOD AND APPARATUS FOR DEPOSITION USING PULSED ATMOSPHERIC PRESSURE GLOW DISCHARGE FUJIFILM MANUFACTURING EUROPE B.V. (NL) 2007-12-06 WO disclosed
WO-2007091891-A1 SHORT PULSE ATMOSPHERIC PRESSURE GLOW DISCHARGE METHOD AND APPARATUS FUJIFILM MANUFACTURING EUROPE B.V. (NL) 2007-08-16 WO disclosed
US-7166335-B2 Layer formation method, and substrate with a layer formed by the method KONICA CORPORATION (JP) 2007-01-23 US disclosed
US-20060199014-A1 supplying discharge gas containing nitrogen into space formed between electrodes transferring energy of excited discharge gas to film forming gas, exposing substrate to film forming gas KONICA MINOLTA HOLDINGS, INC. (JP) 2006-09-07 US disclosed
EP-1645657-A1 METHOD FOR FORMING THIN FILM AND BASE HAVING THIN FILM FORMED BY SUCH METHOD KONICA MINOLTA HOLDINGS, INC. (JP) 2006-04-12 EP disclosed
US-20040213920-A1 Layer formation method, and substrate with a layer formed by the method KONICA CORPORATION (JP) 2004-10-28 US disclosed
US-6759100-B2 ATMOSPHERIC PRESSURE PLASMA DISCHARGE TREATMENT; CHEAP AND SAFE DISCHARGE GAS SUCH AS NITROGEN KONICA CORPORATION (JP) 2004-07-06 US disclosed
US-20030232136-A1 Layer formation method, and substrate with a layer formed by the method KONICA CORPORATION (JP) 2003-12-18 US disclosed
EP-1371752-A2 Layer formation method, and substrate with a layer formed by the method KONICA CORPORATION (JP) 2003-12-17 EP disclosed