SCHEMBL440025

SCHEMBL440025

CC(C)(C)C(=O)OC1C2OC(=O)C3CC1(C)CC32

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL686121 0.90
SCHEMBL47484 0.87
SCHEMBL10061186 0.85 MAPT (0.32)
SCHEMBL11892789 0.84
SCHEMBL14560958 0.83
SCHEMBL14557116 0.83 MAPT (0.33)
SCHEMBL10027343 0.82
SCHEMBL12430023 0.82
SCHEMBL12057576 0.81
SCHEMBL12869731 0.80 ICAM1 (0.32)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 40 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9507258-B2 Resin and photoresist composition comprising the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-11-29 US disclosed
US-9291893-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-22 US disclosed
US-9221928-B2 Fluorine-containing sulfonate resin, fluorine-containing N-sulfonyloxyimide resin, resist composition and pattern formation method CENTRAL GLASS COMPANY, LIMITED (JP) 2015-12-29 US disclosed
US-9221928-B2 Fluorine-containing sulfonate resin, fluorine-containing N-sulfonyloxyimide resin, resist composition and pattern formation method CENTRAL GLASS COMPANY, LIMITED (JP) 2015-12-29 US disclosed
US-9182664-B2 Polymerizable fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern-forming method using same CENTRAL GLASS COMPANY, LIMITED (JP) 2015-11-10 US disclosed
US-9182664-B2 Polymerizable fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern-forming method using same CENTRAL GLASS COMPANY, LIMITED (JP) 2015-11-10 US disclosed
US-9152045-B2 Fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern formation method CENTRAL GLASS COMPANY, LIMITED (JP) 2015-10-06 US disclosed
US-8993212-B2 Fluorine-containing sulfonic acid salts, photo-acid generator and resist composition and pattern formation method utilizing same CENTRAL GLASS COMPANY, LIMITED (JP) 2015-03-31 US disclosed
US-20140287359-A1 Fluorine-Containing Sulfonate, Fluorine-Containing Sulfonate Resin, Resist Composition and Pattern Formation Method CENTRAL GLASS CO LTD (JP) 2014-09-25 US disclosed
US-8791293-B2 Fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern formation method CENTRAL GLASS COMPANY, LIMITED (JP) 2014-07-29 US disclosed
US-20110318542-A1 Fluorine-Containing Compound, Fluorine-Containing Polymer Compound, Resist Composition and Patterning Method Using Same CENTRAL GLASS COMPANY, LIMITED (JP) 2011-12-29 US disclosed
US-20110177453-A1 Fluorine-Containing Sulfonates Having Polymerizable Anions and Manufacturing Method Therefor, Fluorine-Containing Resins, Resist Compositions, and Pattern-Forming Method Using Same CENTRAL GLASS COMPANY, LIMITED (JP) 2011-07-21 US disclosed
US-20110098500-A1 Polymerizable Fluorine-Containing Compound CENTRAL GLASS COMPANY, LIMITED (JP) 2011-04-28 US disclosed
US-7906269-B2 Positive-type resist composition CENTRAL GLASS COMPANY, LIMITED (JP) 2011-03-15 US disclosed
US-7887990-B2 Fluorine-containing compound, fluorine-containing polymer, postive-type resist composition, and patterning process using same CENTRAL GLASS COMPANY, LIMITED (JP) 2011-02-15 US disclosed
US-7887990-B2 Fluorine-containing compound, fluorine-containing polymer, postive-type resist composition, and patterning process using same CENTRAL GLASS COMPANY, LIMITED (JP) 2011-02-15 US disclosed
US-7541131-B2 Resist composition, compound for use in the resist composition and pattern forming method using the resist composition FUJIFILM CORPORATION (JP) 2009-06-02 US disclosed
US-20090061353-A1 Positive-Type Resist Composition CENTRAL GLASS COMPANY, LIMITED (JP) 2009-03-05 US disclosed
US-20090011199-A1 Fluorine-Containing Compound, Fluorine-Containing Polymer, Negative-Type Resist Composition, and Patterning Process Using Same CENTRAL GLASS COMPANY, LIMITED (JP) 2009-01-08 US disclosed
US-20080311507-A1 Fluorine-Containing Compound, Fluorine-Containing Polymer, Postive-Type Resist Composition, And Patterning Process Using Same CENTRAL GLASS COMPANY, LIMITED (JP) 2008-12-18 US disclosed