SCHEMBL4538696

SCHEMBL4538696

Br[SiH2][Si](Br)(Br)Br

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL32684069 0.64
SCHEMBL31738919 0.62
SCHEMBL6972020 0.59
SCHEMBL31738916 0.59
SCHEMBL25406760 0.43
SCHEMBL37498 0.43
SCHEMBL134582 0.43
SCHEMBL1030445 0.43
SCHEMBL8160072 0.43
SCHEMBL8166909 0.43

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 28 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4748968-A1 METHOD FOR FORMING THIN FILM USING TWO TYPES OF SILICON PRECURSOR COMPOUNDS Hansol Chemical Co., Ltd (KR) 2026-05-27 EP claimed
EP-4667616-A1 METHOD FOR THE FORMATION OF THIN FILMS USING TWO TYPES OF SILICON PRECURSOR Hansol Chemical Co., Ltd (KR) 2025-12-24 EP claimed
US-20250369114-A1 METHOD FOR THE FORMATION OF THIN FILMS USING TWO TYPES OF SILICON PRECURSOR HANSOL CHEMICAL CO LTD (KR) 2025-12-04 US claimed
WO-2025018802-A1 METHOD FOR FORMING THIN FILM USING TWO TYPES OF SILICON PRECURSOR COMPOUNDS 주식회사 한솔케미칼 2025-01-23 WO claimed
US-11784026-B2 Substrate processing apparatus, material layer deposition apparatus, and atmospheric pressure chemical vapor deposition apparatus SAMSUNG ELECTRONICS CO., LTD. 2023-10-10 US claimed
US-20210222300-A1 SUBSTRATE PROCESSING APPARATUS, MATERIAL LAYER DEPOSITION APPARATUS, AND ATMOSPHERIC PRESSURE CHEMICAL VAPOR DEPOSITION APPARATUS SAMSUNG ELECTRONICS CO., LTD. (KR) 2021-07-22 US claimed
EP-4748968-A1 METHOD FOR FORMING THIN FILM USING TWO TYPES OF SILICON PRECURSOR COMPOUNDS Hansol Chemical Co., Ltd (KR) 2026-05-27 EP disclosed
EP-4667616-A1 METHOD FOR THE FORMATION OF THIN FILMS USING TWO TYPES OF SILICON PRECURSOR Hansol Chemical Co., Ltd (KR) 2025-12-24 EP disclosed
US-20250369114-A1 METHOD FOR THE FORMATION OF THIN FILMS USING TWO TYPES OF SILICON PRECURSOR HANSOL CHEMICAL CO LTD (KR) 2025-12-04 US disclosed
US-20250038003-A1 LOW TEMPERATURE MOLYBDENUM DEPOSITION ASSISTED BY SILICON-CONTAINING REACTANTS LAM RESEARCH CORPORATION (US) 2025-01-30 US disclosed
WO-2025018802-A1 METHOD FOR FORMING THIN FILM USING TWO TYPES OF SILICON PRECURSOR COMPOUNDS 주식회사 한솔케미칼 2025-01-23 WO disclosed
EP-4449479-A1 LOW TEMPERATURE MOLYBDENUM DEPOSITION ASSISTED BY SILICON-CONTAINING REACTANTS Lam Research Corporation (US) 2024-10-23 EP disclosed
CN-118540936-A Semiconductor device and method for manufacturing the same 三星电子株式会社 2024-08-23 CN disclosed
US-20190333754-A1 Method of Forming a Low-K Layer and Method of Forming a Semiconductor Device SAMSUNG ELECTRONICS CO., LTD. (KR) 2019-10-31 US disclosed
EP-3561860-A1 METHOD OF FORMING A LOW-K LAYER AND METHOD OF FORMING A SEMICONDUCTOR DEVICE Samsung Electronics Co., Ltd. (KR) 2019-10-30 EP disclosed
EP-2637968-B1 PROCESS FOR SELECTIVE CLEAVAGE OF HIGHER SILANES EVONIK DEGUSSA GMBH (DE) 2017-12-06 EP disclosed
US-9481580-B2 Selective splitting of high order silanes EVONIK DEGUSSA GMBH (DE) 2016-11-01 US disclosed
US-20130294995-A1 SELECTIVE SPLITTING OF HIGH ORDER SILANES EVONIK DEGUSSA GMBH (DE) 2013-11-07 US disclosed
EP-2637968-A2 PROCESS FOR SELECTIVE CLEAVAGE OF HIGHER SILANES Evonik Degussa GmbH (DE) 2013-09-18 EP disclosed
WO-2012062560-A2 PROCESS FOR SELECTIVE CLEAVAGE OF HIGHER SILANES EVONIK DEGUSSA GMBH (DE) 2012-05-18 WO disclosed