SCHEMBL4646466

SCHEMBL4646466

CC1C(=O)OCC1O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7053730 1.00
SCHEMBL14473660 0.86 CYP3A4 (0.31)
SCHEMBL5672300 0.82 MEN1 (0.31)
SCHEMBL13537778 0.76
SCHEMBL4651593 0.76
SCHEMBL19363012 0.74
SCHEMBL7906063 0.74
SCHEMBL818248 0.74
SCHEMBL7908838 0.74
SCHEMBL19118462 0.74

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 16 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-116789887-A Ionic photoacid generator film-forming resin copolymer, preparation method and application 中国科学院福建物质结构研究所 2023-09-22 CN claimed
CN-116789887-A Ionic photoacid generator film-forming resin copolymer, preparation method and application 中国科学院福建物质结构研究所 2023-09-22 CN disclosed
US-7862980-B2 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-01-04 US disclosed
US-7862980-B2 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-01-04 US disclosed
US-20090263611-A1 OPTICAL RECORDING MEDIUM, OPTICAL RECORDING MATERIAL AND METAL COMPLEX COMPOUND MITSUBISHI KAGAKU MEDIA CO., LTD. (JP) 2009-10-22 US disclosed
US-7579497-B2 Sulfonium or iodonium salt of aryl(methyl) sulfoacetate in which the alpha carbon is fluoro- or perfluoroalkyl-substituted: triphenylsulfonium (1-(5-hydroxynaphthyl)oxyethoxycarbonyl) difluoromethanesulfonate; acid labile resin; 2-Ethyl-2-adamantyl methacrylate copolymer; improve line edge roughness SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-08-25 US disclosed
US-7579497-B2 Sulfonium or iodonium salt of aryl(methyl) sulfoacetate in which the alpha carbon is fluoro- or perfluoroalkyl-substituted: triphenylsulfonium (1-(5-hydroxynaphthyl)oxyethoxycarbonyl) difluoromethanesulfonate; acid labile resin; 2-Ethyl-2-adamantyl methacrylate copolymer; improve line edge roughness SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-08-25 US disclosed
EP-1473291-B1 PROCESS FOR PRODUCING LACTONE MITSUBISHI RAYON CO (JP) 2008-08-13 EP disclosed
WO-2008087549-A1 POLYMERS USEFUL IN PHOTORESIST COMPOSITIONS AND COMPOSITIONS THEREOF AZ ELECTRONIC MATERIALS USA CORP. (DE) 2008-07-24 WO disclosed
US-20080171270-A1 Polymers Useful in Photoresist Compositions and Compositions Thereof AZ ELECTRONIC MATERIALS USA CORP. 2008-07-17 US disclosed
US-20080171270-A1 Polymers Useful in Photoresist Compositions and Compositions Thereof AZ ELECTRONIC MATERIALS USA CORP. 2008-07-17 US disclosed
WO-2008080988-A2 CYCLOPENTANONE DERIVATIVES, METHOD OF SYNTHESIS AND USES THEREOF NEUROPHARMA, S.A. (ES) 2008-07-10 WO disclosed
US-20080081293-A1 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-04-03 US disclosed
US-20080081293-A1 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-04-03 US disclosed
US-20070078269-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-04-05 US disclosed
US-20070078269-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-04-05 US disclosed