SCHEMBL4863224

SCHEMBL4863224

C=CC(=O)O/C=C/CC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3886085 1.00
SCHEMBL27672149 0.87 TSHR (0.39)
SCHEMBL27673514 0.83 TSHR (0.44)
SCHEMBL11288089 0.81 HCAR2 (0.38)
SCHEMBL1975527 0.79 TSHR (0.50)
SCHEMBL1975528 0.79 TSHR (0.50)
SCHEMBL27969243 0.79
SCHEMBL2534737 0.78 TSHR (0.36)
SCHEMBL30670325 0.78 HPGD (0.48)
SCHEMBL170416 0.77

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240222788-A1 BINDER DISPERSION FOR NON-AQUEOUS SECONDARY BATTERY SEPARATOR, SLURRY COMPOSITION, NON-AQUEOUS SECONDARY BATTERY SEPARATOR, AND NON-AQUEOUS SECONDARY BATTERY ARTIENCE CO., LTD. (JP) 2024-07-04 US disclosed
CN-117461205-A Binder dispersion for nonaqueous secondary battery separator, slurry composition, nonaqueous secondary battery separator, and nonaqueous secondary battery 东洋油墨SC控股株式会社 2024-01-26 CN disclosed
WO-2022254898-A1 BINDER DISPERSION FOR NON-AQUEOUS SECONDARY BATTERY SEPARATOR, SLURRY COMPOSITION, NON-AQUEOUS SECONDARY BATTERY SEPARATOR, AND NON-AQUEOUS SECONDARY BATTERY 東洋インキSCホールディングス株式会社 2022-12-08 WO disclosed
US-7320854-B2 Mixture of oxide particles, polymerizable compound,radiation sensitive decomposer and releasing agent JSR CORPORATION (JP) 2008-01-22 US disclosed
EP-1494072-A2 Radiation sensitive refractive index changing composition, pattern forming method and optical material JSR Corporation (JP) 2005-01-05 EP disclosed
US-20040265737-A1 Radiation sensitive refractive index changing composition, pattern forming method and optical material JSR CORPORATION (JP) 2004-12-30 US disclosed
US-20030013830-A1 Reacting a thiosulfate salt with a halogenated styrenic monomer to form a styrenic thiosulfate salt monomer and then polymerization of said monomer in the presence of an initiator BLEVINS RICHARD W (US) 2003-01-16 US disclosed
US-6420505-B1 STYRENE THIOSULFATE AND OLEFIN MONOMER EASTMAN KODAK COMPANY 2002-07-16 US disclosed