SCHEMBL500326

SCHEMBL500326

CCC(C(=O)O)C(O)C(F)(F)F

nearest known ligand 0.37

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TDP1 Q9NUW8 2/20 0.36
CHRM1 P11229 1/20 0.36
AKR1A1 P14550 1/20 0.36
CHRM3 P20309 1/20 0.36
HTR2A P28223 1/20 0.36
HTR2C P28335 1/20 0.36
ADRA1A P35348 1/20 0.36
HRH1 P35367 1/20 0.36
DRD3 P35462 1/20 0.36
SLC6A3 Q01959 1/20 0.36
HDAC1 Q13547 1/20 0.36
HDAC2 Q92769 1/20 0.36
TP53 P04637 1/20 0.32
PGD P52209 1/20 0.32
CA2 P00918 1/20 0.31
MAPK1 P28482 1/20 0.31
GPR84 Q9NQS5 3/20 0.30
SLC1A3 P43003 2/20 0.30
SLC1A2 P43004 2/20 0.30
SLC1A1 P43005 2/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1532634 1.00 TDP1 (0.36) TDP1CHRM1AKR1A1CHRM3HTR2A
SCHEMBL7514176 1.00 TDP1 (0.36) TDP1CHRM1AKR1A1CHRM3HTR2A
SCHEMBL3696339 0.77 TDP1 (0.36) TDP1CHRM1AKR1A1CHRM3HTR2A
SCHEMBL1568445 0.77 CETP (0.42) TDP1SLC1A3SLC1A2SLC1A1
SCHEMBL1931058 0.77 TDP1 (0.36) TDP1CHRM1AKR1A1CHRM3HTR2A
SCHEMBL499816 0.77 TDP1 (0.36) TDP1CHRM1AKR1A1CHRM3HTR2A
SCHEMBL13761133 0.74 TDP1 (0.50) TDP1CHRM1AKR1A1CHRM3HTR2A
SCHEMBL4756190 0.74 TDP1 (0.50) TDP1CHRM1AKR1A1CHRM3HTR2A
SCHEMBL1604267 0.74 TDP1 (0.50) TDP1CHRM1AKR1A1CHRM3HTR2A
SCHEMBL9494582 0.72 GRIK1 (0.36) TDP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 13 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
JP-2040343-A None JP disclosed
US-20240043593-A1 Fluorine-Containing Polymer CENTRAL GLASS COMPANY, LIMITED (JP) 2024-02-08 US disclosed
US-8105760-B2 Patterning process and pattern surface coating composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-01-31 US disclosed
US-20110305979-A1 RESIST TOP COAT COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-12-15 US disclosed
US-20110123925-A1 POLYMER FOR PROTECTIVE LAYER OF RESIST, AND POLYMER COMPOSITION INCLUDING THE SAME CHEIL INDUSTRIES, INC. (KR) 2011-05-26 US disclosed
US-20100086878-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-04-08 US disclosed
US-20090053657-A1 PATTERNING PROCESS AND PATTERN SURFACE COATING COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-02-26 US disclosed
US-7297461-B2 Radiation sensitive resin composition JSR CORPORATION (JP) 2007-11-20 US disclosed
US-20060194143-A1 Fluorine-containing polymerizable monomers, fluorine-containing polymer compounds, resist compositions using the same, and patterning process CENTRAL GLASS COMPANY, LIMITED (JP) 2006-08-31 US disclosed
US-20050171226-A1 Radiation sensitive resin composition JSR CORPORATION (JP) 2005-08-04 US disclosed
US-6852664-B2 Double metal cyanide catalysts for the preparation of polyether polyols BAYER AKTIENGESELLSCHAFT (DE) 2005-02-08 US disclosed
US-20040092389-A1 Double metal cyanide catalysts for the preparation of polyether polyols BAYER AKTIENGESELLSCHAFT (DE) 2004-05-13 US disclosed
JP-H0240343-A FLUORINE-CONTAINING POLYESTER AND PRODUCTION THEREOF MEITO SANGYO KK 1990-02-09 JP disclosed