SCHEMBL515829

SCHEMBL515829

CCCC[SiH2]N

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28242987 0.87 TSHR (0.50)
SCHEMBL28243787 0.87 TSHR (0.50)
SCHEMBL27535277 0.87 TSHR (0.50)
SCHEMBL1057698 0.87 TSHR (0.50)
SCHEMBL28243781 0.87
SCHEMBL19774 0.77
SCHEMBL8385676 0.69 TSHR (0.46)
SCHEMBL68913 0.69
SCHEMBL9516267 0.67
SCHEMBL704535 0.67 TSHR (0.43)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 367 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-117801003-A Preparation method and preparation device of electronic grade bis (tertiary butyl amino) silane 洛阳中硅高科技有限公司 2024-04-02 CN claimed
CN-116970337-A Photo-curing self-repairing fluorine-silicon super-hydrophobic coating and preparation method and application thereof 常州大学 2023-10-31 CN claimed
CN-116036631-A Device and method for manufacturing electronic grade bis-tertiary butyl amino-silane 贵州威顿晶磷电子材料股份有限公司 2023-05-02 CN claimed
CN-115939251-A Method for preparing silicon-based photoelectrochemical hydrogen production photocathode based on tunneling passivation contact technology 上海航天能源股份有限公司 2023-04-07 CN claimed
CN-115663006-A Semiconductor image sensing device and method of manufacturing the same 台湾积体电路制造股份有限公司 2023-01-31 CN claimed
US-9390912-B2 Film forming method TOKYO ELECTRON LIMITED (JP) 2016-07-12 US claimed
CN-103088311-B The formation method of crystal seed layer and the film build method of silicon-containing film TOKYO ELECTRON LIMITED (JP) 2016-05-11 CN claimed
CN-102891075-B The film build method of amorphous silicon film and film formation device TOKYO ELECTRON LIMITED (JP) 2015-11-18 CN claimed
CN-102543795-B Film formation device TOKYO ELECTRON LIMITED (JP) 2015-09-23 CN claimed
CN-102543830-B Trench embedding method and film-forming apparatus TOKYO ELECTRON LTD 2015-02-11 CN claimed
EP-1418956-A1 ENDOVASCULAR PROSTHESIS COATED WITH A FUNCTIONALISED DEXTRAN DERIVATIVE Floréane Médical Implants (FR) 2004-05-19 EP claimed
US-6716772-B2 Semiconductor device manufacturing method and semiconductor manufacturing apparatus KOKUSAI ELECTRIC CO., LTD. (JP) 2004-04-06 US claimed
CN-1138872-C Deposition of silicon dioxide and silicon oxynitride using bis(tertiarybutylamino) silane �����Ʒ�뻯ѧ��˾ 2004-02-18 CN claimed
WO-2003011355-A1 ENDOVASCULAR PROSTHESIS COATED WITH A FUNCTIONALISED DEXTRAN DERIVATIVE SOFRADIM PRODUCTION (FR) 2003-02-13 WO claimed
US-20020197890-A1 Semiconductor device manufacturing method and semiconductor manufacturing apparatus KOKUSAI ELECTRIC CO., LTD. 2002-12-26 US claimed
US-6486083-B1 Semiconductor device manufacturing method and semiconductor manufacturing apparatus KOKUSAI ELECTRIC CO., LTD. (JP) 2002-11-26 US claimed
US-20010034129-A1 Capacitor constructions, DRAM constructions, semiconductive material assemblies, etching processes, and methods for forming capacitors and DRAMs MOORE JOHN T (US) 2001-10-25 US claimed
US-6251802-B1 REDUCING ETCH RATE MICRON TECHNOLOGY, INC. 2001-06-26 US claimed
CN-1270596-A Bimetallic complexes and polymerization catalysts obtained therefrom DOW CHEMICAL CO (US) 2000-10-18 CN claimed
CN-1239155-A Deposition of silicon dioxide and silicon oxynitride using bis(tertiarybutylamino) silane AIR PROD & CHEM (US) 1999-12-22 CN claimed