⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL28293702 | 1.00 | — | — | |
| SCHEMBL28555616 | 1.00 | — | — | |
| SCHEMBL28295614 | 1.00 | — | — | |
| SCHEMBL11658691 | 1.00 | — | — | |
| SCHEMBL186436 | 1.00 | — | — | |
| SCHEMBL25440124 | 1.00 | — | — | |
| SCHEMBL28293725 | 1.00 | — | — | |
| SCHEMBL6854853 | 0.82 | — | — | |
| SCHEMBL8907582 | 0.82 | — | — | |
| SCHEMBL5598386 | 0.82 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-7311531-B2 | Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method | JSR CORPORATION (JP) | 2007-12-25 | — | — | US | disclosed |
| US-20060211280-A1 | Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method | JSR CORPORATION (JP) | 2006-09-21 | — | — | US | disclosed |
| CN-1765032-A | Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection apparatus, and wafer inspection method | JSR CORP (JP) | 2006-04-26 | — | — | CN | disclosed |
| EP-1608040-A1 | ANISOTROPIC CONDUCTIVE CONNECTOR, CONDUCTIVE PASTE COMPOSITION, PROBE MEMBER, WAFER INSPECTION DEVICE AND WAFER INSPECTION METHOD | JSR Corporation (JP) | 2005-12-21 | — | — | EP | disclosed |