SCHEMBL59490

SCHEMBL59490

C[SiH3].[GeH4]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10801586 0.87
SCHEMBL28589 0.87
SCHEMBL10799439 0.87
SCHEMBL4001746 0.75
SCHEMBL3221599 0.75
SCHEMBL23522850 0.75
Hydrochloric Acid SCHEMBL8355120 0.75
Charcoal, Activated SCHEMBL7626325 0.75
SCHEMBL23398235 0.75
SCHEMBL22684404 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 6892 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260082633-A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2026-03-19 US claimed
US-20260006890-A1 EPITAXIAL LAYERS IN SOURCE/DRAIN CONTACTS AND METHODS OF FORMING THE SAME TAIWAN SEMICONDUCTOR MFG CO LTD (TW) 2026-01-01 US claimed
US-20250218791-A1 SEMICONDUCTOR DEVICE WITH CATALYTIC CONDUCTIVE LAYER AND METHOD FOR FABRICATING THE SAME NANYA TECHNOLOGY CORPORATION (TW) 2025-07-03 US claimed
US-20250218859-A1 SEMICONDUCTOR DEVICE WITH CATALYTIC CONDUCTIVE LAYER AND METHOD FOR FABRICATING THE SAME NANYA TECHNOLOGY CORPORATION (TW) 2025-07-03 US claimed
US-20250218861-A1 SEMICONDUCTOR DEVICE WITH CATALYTIC CONDUCTIVE LAYER AND METHOD FOR FABRICATING THE SAME NANYA TECHNOLOGY CORPORATION (TW) 2025-07-03 US claimed
US-12159938-B2 Semiconductor device SAMSUNG ELECTRONICS CO., LTD. (KR) 2024-12-03 US claimed
CN-118737947-A Semiconductor wafer and manufacturing method thereof, transistor structure and manufacturing method thereof 广州诺尔光电科技有限公司 2024-10-01 CN claimed
CN-118553619-A Forming method of MOSFET device 杭州积海半导体有限公司 2024-08-27 CN claimed
US-12062699-B2 Horizontal Current Bipolar Transistor with Silicon-Germanium base University of Zagreb, Faculty of Electrical Engineering and Computing (HR) 2024-08-13 US claimed
US-20240186361-A1 VISIBLE AND INFRARED IMAGE SENSOR Commissariat à I'énergie atomique et aux énergies alternatives (FR) 2024-06-06 US claimed
US-20020033511-A1 Advanced CMOS using super steep retrograde wells TEXAS INSTRUMENTS INCORPORATED 2002-03-21 US claimed
US-20020016029-A1 Thin film transistor and producing method thereof MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 2002-02-07 US claimed
US-6331476-B1 Thin film transistor and producing method thereof MAUSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 2001-12-18 US claimed
US-6291313-B1 Method and device for controlled cleaving process SILICON GENESIS CORPORATION 2001-09-18 US claimed
US-6197641-B1 Process for fabricating vertical transistors LUCENT TECHNOLOGIES INC. 2001-03-06 US claimed
EP-1063694-A1 Process for fabricating vertical transistors LUCENT TECHNOLOGIES INC. (US) 2000-12-27 EP claimed
EP-1063697-A1 A cmos integrated circuit having vertical transistors and a process for fabricating same LUCENT TECHNOLOGIES INC. (US) 2000-12-27 EP claimed
EP-0989599-A1 Process for fabricating vertical transistors LUCENT TECHNOLOGIES INC. (US) 2000-03-29 EP claimed
US-6027975-A Process for fabricating vertical transistors LUCENT TECHNOLOGIES INC. (US) 2000-02-22 US claimed
US-4885614-A Semiconductor device with crystalline silicon-germanium-carbon alloy HITACHI, LTD. (JP) 1989-12-05 US claimed