Charcoal, Activated

Charcoal, Activated

SCHEMBL59491

[C].[Ge].[Si]

nearest known ligand 0.00

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⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 7022 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-121610898-B Preparation method of IV-group compound epitaxial alloy film 浙江大学 2026-05-22 CN claimed
US-20260082633-A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2026-03-19 US claimed
US-20260006890-A1 EPITAXIAL LAYERS IN SOURCE/DRAIN CONTACTS AND METHODS OF FORMING THE SAME TAIWAN SEMICONDUCTOR MFG CO LTD (TW) 2026-01-01 US claimed
US-20250372373-A1 GATE-ALL-AROUND (GAA) INTERFACE MODIFICATIONS TO IMPROVE ABRUPTNESS APPLIED MATERIALS INC (US) 2025-12-04 US claimed
US-20250218861-A1 SEMICONDUCTOR DEVICE WITH CATALYTIC CONDUCTIVE LAYER AND METHOD FOR FABRICATING THE SAME NANYA TECHNOLOGY CORPORATION (TW) 2025-07-03 US claimed
US-20250218859-A1 SEMICONDUCTOR DEVICE WITH CATALYTIC CONDUCTIVE LAYER AND METHOD FOR FABRICATING THE SAME NANYA TECHNOLOGY CORPORATION (TW) 2025-07-03 US claimed
US-20250218791-A1 SEMICONDUCTOR DEVICE WITH CATALYTIC CONDUCTIVE LAYER AND METHOD FOR FABRICATING THE SAME NANYA TECHNOLOGY CORPORATION (TW) 2025-07-03 US claimed
US-12159938-B2 Semiconductor device SAMSUNG ELECTRONICS CO., LTD. (KR) 2024-12-03 US claimed
CN-118737947-A Semiconductor wafer and manufacturing method thereof, transistor structure and manufacturing method thereof 广州诺尔光电科技有限公司 2024-10-01 CN claimed
CN-118553619-A Forming method of MOSFET device 杭州积海半导体有限公司 2024-08-27 CN claimed
US-20020033511-A1 Advanced CMOS using super steep retrograde wells TEXAS INSTRUMENTS INCORPORATED 2002-03-21 US claimed
US-20020016029-A1 Thin film transistor and producing method thereof MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 2002-02-07 US claimed
US-6331476-B1 Thin film transistor and producing method thereof MAUSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 2001-12-18 US claimed
US-6291313-B1 Method and device for controlled cleaving process SILICON GENESIS CORPORATION 2001-09-18 US claimed
US-6197641-B1 Process for fabricating vertical transistors LUCENT TECHNOLOGIES INC. 2001-03-06 US claimed
EP-1063697-A1 A cmos integrated circuit having vertical transistors and a process for fabricating same LUCENT TECHNOLOGIES INC. (US) 2000-12-27 EP claimed
EP-1063694-A1 Process for fabricating vertical transistors LUCENT TECHNOLOGIES INC. (US) 2000-12-27 EP claimed
EP-0989599-A1 Process for fabricating vertical transistors LUCENT TECHNOLOGIES INC. (US) 2000-03-29 EP claimed
US-6027975-A Process for fabricating vertical transistors LUCENT TECHNOLOGIES INC. (US) 2000-02-22 US claimed
US-4885614-A Semiconductor device with crystalline silicon-germanium-carbon alloy HITACHI, LTD. (JP) 1989-12-05 US claimed