SCHEMBL64897

SCHEMBL64897

CCC(C)CCN

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13819837 1.00
SCHEMBL10299587 1.00
Hydrochloric Acid SCHEMBL9784988 0.97
Hydrochloric Acid SCHEMBL9759307 0.97
Hydrochloric Acid SCHEMBL9759303 0.97
SCHEMBL11095722 0.85 GABRR1 (0.33)
SCHEMBL19733366 0.85 GABRR1 (0.33)
SCHEMBL28468618 0.83
SCHEMBL48612 0.82
SCHEMBL16978757 0.81

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 3164 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2026090241-A1 NON-TRIAZINE BASED SCAVENGERS CHAMPIONX LLC (US) 2026-04-30 WO claimed
US-12613468-B2 Method for forming patterned photoresist TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2026-04-28 US claimed
US-12550901-B2 Compositions containing glufosinate and a synthetic auxin herbicide CORTEVA AGRISCIENCE LLC (US) 2026-02-17 US claimed
EP-4607278-A1 CHEMICALLY-AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR PATTERN PROFILE IMPROVEMENT AND ETCH RESISTANCE ENHANCEMENT Ycchem Co., Ltd. (KR) 2025-08-27 EP claimed
US-20250199405-A1 CHEMICALLY-AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR PATTERN PROFILE IMPROVEMENT AND ETCH RESISTANCE ENHANCEMENT YCCHEM CO., LTD. (KR) 2025-06-19 US claimed
CN-119998727-A Chemically amplified positive resist composition for improving pattern profile and enhancing etch resistance YC化学制品株式会社 2025-05-13 CN claimed
CN-112447501-B Method for forming patterned photoresist layer 台湾积体电路制造股份有限公司 2024-07-26 CN claimed
CN-118185046-A Preparation method of self-repairing material based on reinforced and toughened covalent organic framework filler 安徽工业大学 2024-06-14 CN claimed
WO-2024085293-A1 CHEMICALLY-AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR PATTERN PROFILE IMPROVEMENT AND ETCH RESISTANCE ENHANCEMENT 영창케미칼 주식회사 2024-04-25 WO claimed
US-20240103375-A1 METHOD FOR FORMING PATTERNED PHOTORESIST TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2024-03-28 US claimed
US-4904701-A HYDROLYZING THE ION EXCHANGE PRECURSOR GROUPS OF A FLUOROPOLYMER BY USING AQUEOUS SOLUTION OF A BASIC ORGANIC NITROGEN COMPOUND ASAHI KASEI KOGYO KABUSHIKI KAISHA (JP) 1990-02-27 US claimed
US-4876396-A AT ORTHO POSITION TO HYDROXYL; AMINE CATALYSTS RHONE-POULENC SPECIALITES CHIMIQUES (FR) 1989-10-24 US claimed
US-4855513-A Chlorination of phenolic compounds RHONE-POULENC CHIMIE (FR) 1989-08-08 US claimed
US-4827047-A AMINE CATALYST RHONE-POULENC CHIMIE (FR) 1989-05-02 US claimed
US-4785020-A TWO STEP AMINATION OF HALOALKYL POLYMERS THE DOW CHEMICAL COMPANY (US) 1988-11-15 US claimed
EP-0085592-B1 BOEHMITES AND EXTREMELY PURE PSEUDOBOEHMITES, AND PROCESS FOR THEIR MANUFACTURE RHONE-POULENC CHIMIE (FR) 1986-07-02 EP claimed
US-4399235-A HALOGENATION OF MONOVINYLIDENE AROMATIC POLYMER IN PRESENCE OF ORGANIC LIQUID HAVING HIGH DIELECTRIC CONSTANT THE DOW CHEMICAL COMPANY (US) 1983-08-16 US claimed
EP-0085592-A1 Boehmites and extremely pure pseudoboehmites, and process for their manufacture RHONE-POULENC CHIMIE (FR) 1983-08-10 EP claimed
US-4321331-A High density ion exchange resins from haloalkylated aromatic polymer THE DOW CHEMICAL COMPANY (US) 1982-03-23 US claimed
US-4169105-A FROM CYANOACETIC ACID AND AN ALLYLIC HALIDE, ACID ACCEPTOR SHELL OIL COMPANY (US) 1979-09-25 US claimed