SCHEMBL650230

SCHEMBL650230

CCCCn1c(-c2ccccc2)nc(C#N)c1CN(Cc1ccc(C(=O)O)cc1)Cc1ccc2c(c1)OCCO2

nearest known ligand 0.49

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
C5AR1 P21730 1/20 0.49
PTGES O14684 2/20 0.42
ALOX5 P09917 2/20 0.42
LTA4H P09960 2/20 0.39
PTGDR2 Q9Y5Y4 3/20 0.38
CYP2C8 P10632 1/20 0.38
CYP2C9 P11712 1/20 0.38
CYP2C19 P33261 1/20 0.38
TAS2R14 Q9NYV8 1/20 0.38
TSHR P16473 6/20 0.38
ALDH1A1 P00352 4/20 0.38
GAA P10253 1/20 0.38
HPGD P15428 1/20 0.38
MAPK1 P28482 1/20 0.37
LMNA P02545 1/20 0.36
PPARG P37231 1/20 0.36
PPARA Q07869 1/20 0.36
MAPT P10636 3/20 0.36
MEN1 O00255 2/20 0.36
KMT2A Q03164 2/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL650512 0.93 C5AR1 (0.55) C5AR1PTGDR2CYP2C8CYP2C9CYP2C19
SCHEMBL648085 0.93 C5AR1 (0.46) C5AR1PTGESALOX5PTGDR2CYP2C8
SCHEMBL651692 0.92 C5AR1 (0.40) C5AR1PTGESALOX5LTA4HPTGDR2
SCHEMBL1913102 0.90 C5AR1 (0.52) C5AR1PTGESALOX5LTA4HPTGDR2
SCHEMBL651019 0.89 C5AR1 (0.53) C5AR1TAS2R14TSHRALDH1A1HPGD
SCHEMBL648636 0.89 C5AR1 (0.51) C5AR1PTGESALOX5LTA4HPTGDR2
SCHEMBL650916 0.89 C5AR1 (0.58) C5AR1PTGESALOX5LTA4HPTGDR2
SCHEMBL648848 0.88 C5AR1 (0.51) C5AR1PTGESALOX5LTA4HPTGDR2
SCHEMBL650282 0.88 C5AR1 (0.51) C5AR1PTGESALOX5LTA4HPTGDR2
SCHEMBL648818 0.88 C5AR1 (0.62) C5AR1TSHRALDH1A1HPGDLMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 43 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20220177653-A1 FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2022-06-09 US disclosed
US-9946158-B2 Composition for forming resist underlayer film for nanoimprint NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2018-04-17 US disclosed
US-9337052-B2 Silicon-containing EUV resist underlayer film forming composition NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2016-05-10 US disclosed
US-20150099070-A1 COMPOSITION FOR FORMING RESIST UNDERLAYER FILM FOR NANOIMPRINT NISSAN CHEMICAL IND LTD (JP) 2015-04-09 US disclosed
US-8864894-B2 Resist underlayer film forming composition containing silicone having onium group NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2014-10-21 US disclosed
US-8815494-B2 Resist underlayer film forming composition containing silicon having anion group NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2014-08-26 US disclosed
US-20140232018-A1 SILICON-CONTAINING EUV RESIST UNDERLAYER FILM FORMING COMPOSITION NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2014-08-21 US disclosed
US-20140127114-A1 POROUS SILICA, OPTICAL-PURPOSE LAYERED PRODUCT AND COMPOSITION, AND METHOD FOR PRODUCING POROUS SILICA MITSUBISHI CHEMICAL CORPORATION (JP) 2014-05-08 US disclosed
US-8496849-B2 Liquid crystal aligning agent, liquid crystal alignment film and liquid crystal display device JSR CORPORATION (JP) 2013-07-30 US disclosed
US-8450045-B2 Pattern forming method JSR CORPORATION (JP) 2013-05-28 US disclosed
US-6828078-B2 Photoresist for use in optoelectronic and display fields; porosity; optical fibers JSR CORPORATION (JP) 2004-12-07 US disclosed
US-6824833-B2 STACKED DIELECTRIC JSR CORPORATION (JP) 2004-11-30 US disclosed
US-6787289-B2 OPTICS JSR CORPORATION (JP) 2004-09-07 US disclosed
US-20040013972-A1 Radiation-sensitive composition changing in refractive index and method of changing refractive index JSR CORPORATION (JP) 2004-01-22 US disclosed
US-20040005506-A1 Composition having permitivity being radiation-sensitively changeable and method for forming permitivity pattern JSR CORPORATION (JP) 2004-01-08 US disclosed
US-6576393-B1 Hydrolysate and/or a condensate of a siloxane compound; compound generating an acid by ultraviolet irradiation and/or heating; adhesion, resistance to a developing solution, decrease in film loss in oxygen ashing of the resist JSR CORPORATION (JP) 2003-06-10 US disclosed
US-20030077461-A1 Stacked film, insulating film and substrate for semiconductor JSR CORPORATION (JP) 2003-04-24 US disclosed
US-6465368-B2 DISSOLVING POLYMER IN SOLVENT; FORMING DIELECTRIC FILMS JSR CORPORATION (JP) 2002-10-15 US disclosed
US-6406794-B1 POLYETHERSILOXANE COPOLYMER JSR CORPORATION (JP) 2002-06-18 US disclosed
US-20010051446-A1 Method of manufacturing insulating film-forming material, the insulating film-forming material, and insulating film JSR CORPORATION (JP) 2001-12-13 US disclosed