SCHEMBL6995440

SCHEMBL6995440

C=C(C(=O)OC1(CCCC)CCCC1)C(F)(F)F

nearest known ligand 0.32

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
FAAH O00519 8/20 0.32
MEN1 O00255 2/20 0.31
KMT2A Q03164 2/20 0.31
CES2 O00748 3/20 0.31
CES1 P23141 5/20 0.31
CYP1A2 P05177 1/20 0.31
HSD17B10 Q99714 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6856837 0.84
SCHEMBL12190115 0.83
SCHEMBL4401688 0.81 TSHR (0.42) MEN1KMT2A
SCHEMBL3221563 0.80 TSHR (0.41) MEN1KMT2A
SCHEMBL12521047 0.80 TSHR (0.41) MEN1KMT2A
SCHEMBL15284478 0.77 TSHR (0.45) MEN1KMT2A
SCHEMBL6431291 0.77
Methacrylic Acid SCHEMBL28308876 0.77 TSHR (0.38) MEN1KMT2A
SCHEMBL21127001 0.76 CYP4F2 (0.36) MEN1KMT2A
SCHEMBL3225251 0.76 TSHR (0.44) MEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 15 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8557501-B2 Developable bottom antireflective coating compositions especially suitable for ion implant applications INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-10-15 US disclosed
US-8557501-B2 Developable bottom antireflective coating compositions especially suitable for ion implant applications INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-10-15 US disclosed
US-20120178029-A1 DEVELOPABLE BOTTOM ANTIREFLECTIVE COATING COMPOSITIONS ESPECIALLY SUITABLE FOR ION IMPLANT APPLICATIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-07-12 US disclosed
US-20120178029-A1 DEVELOPABLE BOTTOM ANTIREFLECTIVE COATING COMPOSITIONS ESPECIALLY SUITABLE FOR ION IMPLANT APPLICATIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-07-12 US disclosed
US-8182978-B2 Developable bottom antireflective coating compositions especially suitable for ion implant applications INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-05-22 US disclosed
US-8182978-B2 Developable bottom antireflective coating compositions especially suitable for ion implant applications INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-05-22 US disclosed
US-20100196825-A1 DEVELOPABLE BOTTOM ANTIREFLECTIVE COATING COMPOSITIONS ESPECIALLY SUITABLE FOR ION IMPLANT APPLICATIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-08-05 US disclosed
WO-2010086288-A1 DEVELOPABLE BOTTOM ANTIREFLECTIVE COATING COMPOSITIONS ESPECIALLY SUITABLE FOR ION IMPLANT APPLICATIONS AND METHOD OF FORMING A PATTERN USING IT INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-08-05 WO disclosed
US-20100196825-A1 DEVELOPABLE BOTTOM ANTIREFLECTIVE COATING COMPOSITIONS ESPECIALLY SUITABLE FOR ION IMPLANT APPLICATIONS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-08-05 US disclosed
US-7651831-B2 Positive photoresist composition with a polymer including a fluorosulfonamide group and process for its use INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-01-26 US disclosed
US-7651831-B2 Positive photoresist composition with a polymer including a fluorosulfonamide group and process for its use INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-01-26 US disclosed
US-7638264-B2 forming pattern on semiconductors; acrylic terpolymer with fluorosulfonamide-containing unit e.g. 2-trifluoromethanesulfonylaminoethyl methacrylate, second unit having pendant acid labile group, and third unit having a lactone moiety, and acid generator; good etch resistance and dissolution properties INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-12-29 US disclosed
US-7638264-B2 forming pattern on semiconductors; acrylic terpolymer with fluorosulfonamide-containing unit e.g. 2-trifluoromethanesulfonylaminoethyl methacrylate, second unit having pendant acid labile group, and third unit having a lactone moiety, and acid generator; good etch resistance and dissolution properties INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-12-29 US disclosed
US-20080233514-A1 POSITIVE PHOTORESIST COMPOSITION WITH A POLYMER INCLUDING A FLUOROSULFONAMIDE GROUP AND PROCESS FOR ITS USE INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2008-09-25 US disclosed
US-20080233514-A1 POSITIVE PHOTORESIST COMPOSITION WITH A POLYMER INCLUDING A FLUOROSULFONAMIDE GROUP AND PROCESS FOR ITS USE INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2008-09-25 US disclosed