⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL11022131 | 0.74 | — | — | |
| SCHEMBL152002 | 0.69 | — | — | |
| SCHEMBL3688172 | 0.69 | — | — | |
| SCHEMBL176361 | 0.64 | — | — | |
| SCHEMBL9496720 | 0.64 | — | — | |
| SCHEMBL12680907 | 0.62 | — | — | |
| SCHEMBL8984143 | 0.62 | — | — | |
| SCHEMBL1803580 | 0.60 | — | — | |
| SCHEMBL19973259 | 0.60 | — | — | |
| SCHEMBL15107770 | 0.60 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 21 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| CN-106992114-A | High temperature atomic layer deposition of silicon-containing films | 弗萨姆材料美国有限责任公司 | 2017-07-28 | — | — | CN | claimed |
| CN-106992114-A | High temperature atomic layer deposition of silicon-containing films | 弗萨姆材料美国有限责任公司 | 2017-07-28 | — | — | CN | disclosed |
| US-8124885-B2 | Anisotropically conductive connector and anisotropically conductive connector device | JSR CORPORATION (JP) | 2012-02-28 | — | — | US | disclosed |
| US-20090159325-A1 | ANISOTROPICALLY CONDUCTIVE CONNECTOR AND ANISOTROPICALLY CONDUCTIVE CONNECTOR DEVICE | JSR CORPORATION (JP) | 2009-06-25 | — | — | US | disclosed |
| EP-2015399-A1 | ANISOTROPIC CONDUCTIVE CONNECTOR AND ANISOTROPIC CONDUCTIVE CONNECTOR DEVICE | JSR Corporation (JP) | 2009-01-14 | — | — | EP | disclosed |
| US-7446544-B2 | Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method | JSR CORPORATION (JP) | 2008-11-04 | — | — | US | disclosed |
| US-20070178727-A1 | Probe apparatus,wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method | JSR CORPORATION (JP) | 2007-08-02 | — | — | US | disclosed |
| US-20070040245-A1 | Anisotropic conductive sheet, manufacturing method thereof, and product using the same | JSR CORPORATION (JP) | 2007-02-22 | — | — | US | disclosed |
| US-20070001701-A1 | Circuit board inspection device | JSR CORPORATION (JP) | 2007-01-04 | — | — | US | disclosed |
| EP-1544625-B1 | ANISOTROPIC, CONDUCTIVE SHEET AND IMPEDANCE MEASURING PROBE | JSR CORP (JP) | 2006-12-27 | — | — | EP | disclosed |
| US-20060177971-A1 | Anisotropically conductive connector, production process thereof and application product thereof | JSR CORPORATION (JP) | 2006-08-10 | — | — | US | disclosed |
| EP-1686655-A1 | ANISOTROPIC CONDUCTIVE SHEET, MANUFACTURING METHOD THEREOF, AND PRODUCT USING THE SAME | JSR Corporation (JP) | 2006-08-02 | — | — | EP | disclosed |
| US-7071722-B2 | Anisotropic, conductive sheet and impedance measuring probe | JSR CORPORATION (JP) | 2006-07-04 | — | — | US | disclosed |
| EP-1674874-A1 | CIRCUIT BOARD INSPECTION DEVICE | JSR Corporation (JP) | 2006-06-28 | — | — | EP | disclosed |
| US-20060006884-A1 | Anisotropic, conductive sheet and impedance measuring probe | JSR CORPORATION (JP) | 2006-01-12 | — | — | US | disclosed |
| EP-1544625-A1 | ANISOTROPIC, CONDUCTIVE SHEET AND IMPEDANCE MEASURING PROBE | JSR Corporation (JP) | 2005-06-22 | — | — | EP | disclosed |
| US-6841876-B2 | Anisotropically conductive sheet, production process thereof and connector | JSR CORPORATION (JP) | 2005-01-11 | — | — | US | disclosed |
| US-20040217342-A1 | Easy positioning, holding and fixing to circuit device | JSR CORPORATION (JP) | 2004-11-04 | — | — | US | disclosed |
| US-20040080048-A1 | Anisotropically conductive sheet, production process thereof and connector | JSR CORPORATION (JP) | 2004-04-29 | — | — | US | disclosed |
| US-6690564-B1 | Anisotropically conductive sheet, production process thereof and connector | JSR CORPORATION (JP) | 2004-02-10 | — | — | US | disclosed |